5 research outputs found
Propriedades elétricas e microestrutura de Céria dopada com Gd+3 e Y+3 para aplicação como eletrólitos em pilhas a combustível
- Author
- Arai H.
- BADWAL S.P.S.
- CHIBA R.
- DE SOUZA D.P.F.
- DE SOUZA D.P.F.
- Dulcina P. F. de Souza
- FERGUS J.W.
- Fábio C. Antunes
- Guilherme B. Crochemore
- GUO X.
- GUO X.
- KHARTON V.V
- KHARTON V.V.
- KLEITZ M.
- MARICLE D.L.
- MCINTOSH S.
- MOGENSEN M.
- ORMEROD R.M.
- PASCUAL C.
- SEO D. J.
- SHA X.
- SILVA C.L.
- SOUZA D.P.F.
- STEELE B.C.H.
- SUBBARAO E.C.
- VERKERK M.J.
- WATT I.M.
- WINCEWICZ K.C.
- YAHIRO H.
- ZHANG T. S.
- ZHANG T.S.
- ZHANG T.S.
- ZHOU X.-D.
- Publication venue
- 'FapUNIFESP (SciELO)'
- Publication date
- Field of study
Full text linkElectronic conductivity measurement of gadolinia doped ceria by DC-partial-polarization
- Publication venue
- 'Springer Science and Business Media LLC'
- Publication date
- Field of study
No full textEffect of Ethanol Toxicity on Enzyme Activity in Anaerobic Respiration in Plants
- Author
- Publication venue
- 'Kansas Academy of Science'
- Publication date
- Field of study
No full textCharacterization of Pr- and Sm-Doped Ce0.8Gd0.2O2 ? ?
- Author
- Publication venue
- 'Springer Science and Business Media LLC'
- Publication date
- Field of study
No full textLithium–oxygen (air) batteries (state-of-the-art and perspectives)
- Author
- A. Basile
- A. Debart
- A. Debart
- A. Kraytsberg
- A. Riaz
- A.K. Thapa
- B. Garcia
- B. Kumar
- B. Sun
- B. Xie
- B.D. McCloskey
- B.D. McCloskey
- B.D. McCloskey
- B.D. McCloskey
- B.D. McCloskey
- B.M. Gallant
- C. Jang
- C. Kavakli
- C. Laoire
- C. Liebenow
- C. Monroe
- C. Tran
- C. Tran
- C.J. Allen
- C.J. Allen
- C.O. Laoire
- D. Aurbach
- D. Aurbach
- D. Aurbach
- D. Shanmukaraj
- D. Xu
- D. Zhang
- D. Zhang
- D. Zhang
- D.L. Maricle
- D.M. Itkis
- D.T. Sawyer
- E. Nasybulin
- E. Yilmaz
- E. Zygadło-Monikowska
- E.J. Nemanick
- E.J. Nemanick
- E.L. Littauer
- F. Cheng
- F. Li
- F. Li
- F. Mizuno
- F. Soavi
- F.T. Wagner
- G. Girishkumar
- G. Zhao
- G. Zhao
- G.A. Umeda
- G.M. Veith
- G.M. Veith
- H. Beyer
- H. Cheng
- H. Jung
- H. Jung
- H. Lim
- H. Nakamoto
- H. Ota
- H. Ota
- H. Ota
- H. Sakaebe
- H. Sano
- H. Zhou
- H.-D. Lim
- H.-G. Jung
- H.W. Park
- I. Kowalczk
- I.G. Gurevich
- I.M. AlNashef
- J. Adams
- J. Hassoun
- J. Herranz
- J. Kang
- J. Lu
- J. Read
- J. Read
- J. Read
- J. Shui
- J. Steiger
- J. Wang
- J. Xiao
- J. Xiao
- J. Yamaki
- J.-J. Xu
- J.-S. Lee
- J.G. Zhou
- J.K. Stark
- J.K.S. Goodman
- J.L. Allen
- J.L. Barton
- J.P. Zheng
- J.R. Harding
- J.S. Hummelshoj
- J.S. Hummelshoj
- J.Z. Chen
- K. Kanamura
- K. Kinoshita
- K. Takechi
- K. Xu
- K. Yoo
- K.M. Abraham
- K.M. Abraham
- K.U. Schwenke
- L. Cindrella
- L.J. Hardwick
- M. Armand
- M. Armand
- M. Balaish
- M. Fulem
- M. Hayyan
- M. Mirzaeian
- M. Morita
- M.D. Radin
- M.H. Cho
- M.J. Trahan
- M.M. Ottakam Thotiyl
- M.R. Tarasevich
- M.R. Tarasevich
- M.W. Chase Jr.
- N. Choi
- N. Imanishi
- N. Shuster
- N. Tsiouvaras
- N.G. Nair
- P. Albertus
- P. Du
- P. Kichambare
- P. Knauth
- R. Black
- R. Black
- R.E. Fuentes
- R.G. Pearson
- R.R. Mitchell
- R.S. Assary
- R.S. Kalubarme
- S. Hasegawa
- S. Meini
- S. Meini
- S. Oswald
- S. Shiraishi
- S.-M. Han
- S.A. Freunberger
- S.A. Freunberger
- S.H. Oh
- S.H. Oh
- S.J. Visco
- S.J. Visco
- S.J. Visco
- S.S. Sandhu
- Sh.S. Zhang
- St. Meini
- T. Kuboki
- T. Ogasawara
- T. Zhang
- T. Zhang
- T. Zhang
- T. Zhang
- T. Zhang
- T.T. Truong
- U. Sahapatsombut
- U. Sahapatsombut
- V. Giordani
- V. Viswanathan
- V. Viswanathan
- V.I. Sirenko
- V.P. Reddy
- V.S. Bryantsev
- V.S. Bryantsev
- W. Walker
- W. Xu
- W. Xu
- W.C. West
- X. Ren
- X. Sun
- X.J. Wang
- Y. Chen
- Y. Katayama
- Y. Li
- Y. Sawada
- Y. Shao
- Y. Shen
- Y. Shimonishi
- Y. Sun
- Y. Wang
- Y.-C. Lu
- Y.-C. Lu
- Y.-C. Lu
- Y.-Ch. Lu
- Y.-Ch. Lu
- Y.-Ch. Lu
- Y.C. Lu
- Y.F. Wang
- Y.L. Li
- Y.M. Lee
- Yu.A. Chizmadzhev
- Z. Jian
- Z. Peng
- Z.-I. Takehara
- Z.C. Zhang
- Z.H. Cui
- Z.H. Cui
- Z.P. Rosol
- Z.Q. Peng
- Zh. Du
- Publication venue
- 'Pleiades Publishing Ltd'
- Publication date
- Field of study
No full text
