A Grazing-Incidence Small-Angle X-Ray Scattering View of Vertically Aligned ZnO Nanowires

We report a grazing-incidence small-angle X-ray scattering study of ZnO films with vertically aligned and randomly distributed nanowires, grown through a hydrothermal growth process on nanostructured ZnO seeding coatings and deposited by electron beam evaporation on silicon and glass, respectively. The comparison of the scattering patterns of seeding coatings and nanowires showed that the scattering of vertically aligned nanowires exhibited a specific feature: the dominant characteristic of their scattering patterns is the appearance of fine structure effects around the specular peak. These effects were clarified by the combined reflection and scattering phenomena, suggested for the aligned nanowires-substrate system. Furthermore, they enabled the calculation of the average gyration radius of nanowires in horizontal direction. The calculated value was in good agreement with the radii of nanowires estimated by surface electron microscopy. Therefore, the observed feature in the scattering pattern can serve as evidence of the aligned growth of nanowires

GISAXS/GIXRD View of ZnO Films with Hierarchical Structural Elements

ZnO films constituted of porous sheet-like structures, formed by calcination of precursor, were examined using scanning electron microscopy and simultaneous small-angle scattering and diffraction of the synchrotron-sourced X-rays, under the grazing-incidence conditions. The presented analysis enabled insight into the complexity of the film morphology, which revealed substrate sensitivity on the microscopic and nanoscopic length scales. The average size and spatial arrangement of nanoparticles, single-crystal domains, and the average size and features of nanopores in sheet-like structures were determined for films deposited on glass, polycrystalline ZnO layer, and silicon