3 research outputs found
X-ray scattering by nano-particles within granular thin films, investigation by grazing angle X-ray reflectometry
It is shown here that the observation of the phenomenon of like small angle
scattering of X-rays in very thin heterogeneous films, can be made
comparatively easily by using grazing angle reflectometry of X-rays. The
feasibility was achieved with co-sputtered thin films of approximately
600 Ã… thickness, made up by crystalline platinum clusters embedded in an
amorphous alumina matrix. The experimental reflectivity profiles are
simulated by the intensity superposition
of two components: (i) the
specular part caused by the usual interference phenomenon between the
partial waves reflected from the air-film and film-substrate interfaces, and
(ii) the like-small angle scattering part due to diffraction by
platinum clusters. It is found that the shape of such clusters is spherical
characterized by mean values of diameter
and inter-cluster
distance of the
order 29 Ã… and 45 Ã… respectively with standard
deviations and
of the order of 3 Ã… . Such
an observation of both the
interference and diffraction phenomena indicates
that the thin granular film exhibits both its continuous and heterogeneous
aspects together