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1 research outputs found
Breaking the Vicious Cycle of Patent Damages
Author
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&
+45Â more
&
&
&
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. V Microsoft Corp
A Mark
A. Douglas Melamed
D N J
Dan L Burk
David O Id
Dow Chemical
E D N
E D Tex
E G See
E G See
E G See
Ernest Grumbles
F
F
F Scott Kieff
Id
Id
Id
Id
Id
Id
Id
K William Watson
Layne-Farrar &
Lift-U V. Ricon
Microsoft Corp
Realtek V Semiconductor Corp
Rite-Hite
See Lucent
See Patstats
See Roger
See Timothy
Shapiro Lemley
The
The
The
The
Voda V. Cordis
William F Lee
Publication venue
'Elsevier BV'
Publication date
01/01/2015
Field of study
No full text
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