1 research outputs found
Theory of Defects in the MOS System
- Author
- A Carrico
- A Redondo
- A Redondo
- A. H. Edwards
- AH Edwards
- BB Triplett
- D. L Griscom
- DC Allan
- DK Biegelsen
- DL Griscom
- DL Griscom
- DL Griscom
- EH Poindexter
- EH Poindexter
- EH Poindexter
- EJ Friebele
- FJ Feigl
- For a thorough though somewhat dated review of charge trapping in the MOS system
- G Lucovsky
- GJ Gerardi
- HS Witham
- J Isoya
- J Vitko
- J. K. Rudra
- J. K. Rudra
- K. L. Brower
- K. L. Yip
- Lenahan and Dressendorfer J
- M Cook
- M Stapelbroek
- M. G. Jani
- PJ Bishof
- R. H. Silsbee
- RC Bingham
- ST Pantelides
- T-E Tsai
- W. Carlos
- Y Bar-Yam
- Publication venue
- 'Springer Science and Business Media LLC'
- Publication date
- 01/01/1988
- Field of study