2 research outputs found
Residual stress distribution on surface-treated Ti-6Al-4V by X-ray diffraction
- Author
- Publication venue
- 'Springer Science and Business Media LLC'
- Publication date
- Field of study
Spectrometers and Spectroscopes
- Author
- Beiser A.
- Bromwich T. J.
- Cutnell John D
- Desmarais Louis
- Drisoll Walter G
- Edmund Industrial Optics
- Esser Co
- Francon M.
- Giancoli Douglas C
- Griot Melles
- Guy Martin
- Guy Martin
- Halliday D.
- Hecht Eugene
- Hecht Jeff
- Jacobs Stephen F
- Jenkins F. W.
- Jones
- Lambda Research Optics Inc
- Lerner R. G.
- Loewen E. G.
- Malacara Daniel
- McDermott L. C.
- Naess R. O.
- Page David
- Pedrotti Frank L
- Plamer Christopher
- Product Knowledge
- Romine Gregory S
- Sciencetech
- Serway Raymond A
- Silverman M. P.
- Smith W. J.
- Walker James S
- Warren Mashuri L
- White Harvey E
- Wilson J. D.
- Woods Nancy
- Young Hugh D
- Publication venue
- 'Informa UK Limited'
- Publication date
- Field of study