Hierarchical Test Generation for Combinational Circuits with Real Defects Coverage

This paperdeals with the automatictes pattern generation (ATPG) technique at the higher level usel a functional fault model and defect-fault relationslt in the form of a defect coverage table at the lower level. The papercontributes totes pattern generation (TPG)techniques taking into account physntK defect localis#fiIK; A new parameter ----probabilisy# e#ectivenes of inputpatterns ----has been usn in the TPG technique with the goal ofincreas;y real defect coverage.This parameteris basm onprobabilities ofphysDfiL defects in digitalcells which may occur in real integratedcircuits This improvementhas been implemented into theexis)#L DefGen ATPGsPGKy for combinational # 2002Elsq)D# Science Ltd. Allrights restsDq 1. I442G-2334 Each posKL-L phys-Lfi defect in atesI- circuit sircu be covered by the tes method thatleads to the lowes overall tesllK cosll taking into account e.g. complexity of thetes pattern generation (TPG) and the tes application time. The problem of finding an optimal tes ss for atesqcircuit with acceptable fault coverage is an importanttas indiagnos;q# of complex digital circuits andsdKfififiL Ithas beenpublisx- that high sghK-xLDfiK;qy (SAF) coverage cannot guarantee high quality oftes)IxK esIxK;qqfor CMOS integrated circuits The SAF modelignores the actual behaviour of digitalcircuits implementedas CMOS integratedcircuits anddoes not adequatelyrepresel the majority of real integratedcircuits defects andfailures [1--5]. Some of sK# defects can be detected by I DDQtes)K) and sdK TPGtechniques have been developed for as##II only ofdefects [6--14]. Itis di#cult to generatetes patterns for both voltage and I DDQtes)K directly forphysDqI defects usec thelowes level of the circuitsrcuitK# and di#erent faultmodels Such TPGis obviousq not feasa -K becaus of..

Laser Spectroscopic and Theoretical Studies of Encapsulation Complexes of Calix[4]arene

The complexes between the host calix[4]arene (C4A) and various guest molecules such as NH3, N2, CH4, and C2H2 have been investigated via experimental and theoretical methods. The S1-S0 electronic spectra of these guest-host complexes are observed by mass-selected resonant two-photon ionization (R2PI) and laser induced fluorescence (LIF) spectroscopy. The infrared (IR) spectra of the complexes formed in molecular beams are obtained by IR-UV double resonance (IR-UV DR) and IR photodissociation (IRPD) spectroscopy. The supramolecular structures of the complexes are investigated by electronic structure methods (density functional and second order perturbation theory). The current results for the various molecular guests are put in perspective with the previously reported ones for the C4A-Rare Gas (Rg) (Phys. Chem. Chem. Phys. 2007, 126, 141101) and C4A-H2O complexes (J. Phys. Chem. A, 2010, 114, 2967). The electronic spectra of the complexes of C4A with N2, CH4 and C2H2 exhibit red-shifts of similar magnitudes with the ones observed for the C4A-Rg complexes, whereas the complexes of C4A with H2O and NH3 show much larger red-shifts. Most of the IR-UV DR spectra of the complexes, except for C4A-C2H2, show a broad hydrogen bonded OH stretching band with a peak at ~3160 cm-1. The analysis of the experimental results, in agreement with the ones resulting from the electronic structure calculations, suggests that C4A preferentially forms endo-complexes with all the guest species reported in this study. We discuss the similarities and differences of the structures, binding energies and the nature of the interaction between the C4A host and the various guest species.This is a preprint of an article published by American Chemical Society in Journal of Physical Chemistry A, 2011, available online: http://pubs.acs.org/doi/abs/10.1021/jp204577j.This work is supported from the Japan Society for the Promotion of Science (JSPS) through a Grant-in-Aid project (No. 18205003) and from MEXT through a Grant-in-Aid for the Scientific Research on Priority Area “Molecular Science for Supra Functional Systems” (No. 477)