Redundancy Allocation of Partitioned Linear Block Codes

Most memories suffer from both permanent defects and intermittent random errors. The partitioned linear block codes (PLBC) were proposed by Heegard to efficiently mask stuck-at defects and correct random errors. The PLBC have two separate redundancy parts for defects and random errors. In this paper, we investigate the allocation of redundancy between these two parts. The optimal redundancy allocation will be investigated using simulations and the simulation results show that the PLBC can significantly reduce the probability of decoding failure in memory with defects. In addition, we will derive the upper bound on the probability of decoding failure of PLBC and estimate the optimal redundancy allocation using this upper bound. The estimated redundancy allocation matches the optimal redundancy allocation well.Comment: 5 pages, 2 figures, to appear in IEEE International Symposium on Information Theory (ISIT), Jul. 201

Coding for Memory with Stuck-at Defects

In this paper, we propose an encoding scheme for partitioned linear block codes (PLBC) which mask the stuck-at defects in memories. In addition, we derive an upper bound and the estimate of the probability that masking fails. Numerical results show that PLBC can efficiently mask the defects with the proposed encoding scheme. Also, we show that our upper bound is very tight by using numerical results.Comment: 6 pages, 5 figures, IEEE International Conference on Communications (ICC), Jun. 201

Coding scheme for 3D vertical flash memory

Recently introduced 3D vertical flash memory is expected to be a disruptive technology since it overcomes scaling challenges of conventional 2D planar flash memory by stacking up cells in the vertical direction. However, 3D vertical flash memory suffers from a new problem known as fast detrapping, which is a rapid charge loss problem. In this paper, we propose a scheme to compensate the effect of fast detrapping by intentional inter-cell interference (ICI). In order to properly control the intentional ICI, our scheme relies on a coding technique that incorporates the side information of fast detrapping during the encoding stage. This technique is closely connected to the well-known problem of coding in a memory with defective cells. Numerical results show that the proposed scheme can effectively address the problem of fast detrapping.Comment: 7 pages, 9 figures. accepted to ICC 2015. arXiv admin note: text overlap with arXiv:1410.177