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3 research outputs found

Fast interface characterization of tunnel oxide MOS structures

Author: B. Sell
D. Schumann
W.H. Krautschneider
Publication venue: 'Institute of Electrical and Electronics Engineers (IEEE)'
Publication date
Field of study

Impact of Soft and Hard Breakdown on Analog and Digital Circuits

Author: A. Avellan
W.H. Krautschneider
Publication venue: 'Institute of Electrical and Electronics Engineers (IEEE)'
Publication date
Field of study

A New Tool for Simulation of Single Electron Transistor based Microprocessor Using Vector File

Author: Cadence
Deng G.
Krautschneider W.H.
Kuhn K.
Lee C.H.
Li Q.
Mahapatra S.
Malvino AP. .
Ou X.
Parekh R.
Parekh R.
Raut V.
Venkataratnam A.
Zhang W.
Publication venue: 'Bentham Science Publishers Ltd.'
Publication date
Field of study

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