Eliciting stories of gender-transformative change: Investigating the effectiveness of question prompt formulations in qualitative gender assessments

Evaluations of gender equality initiatives in development programmes traditionally assess cognitive dimensions such as knowledge, attitudes, and awareness; and often rely solely on women’s perspectives. Leveraging story-based evaluation methods, this article explores the assessment of complex gender-transformations and focuses on effective question prompts to elicit significant and meaningful narratives of change from both women and men. In collaboration with a development programme in Cambodia, a staff assessment process led to a set of criteria for considering the quality of respondent stories and testing the efficacy of four different question prompts (n = 176): verb-, value-, sphere-, and theme-based. Highlighting aspects of embodiment, the study suggests that verb-based prompts were the most effective at eliciting stories that reflect diverse experiences of both women and men in processes of gender-transformation. Findings from our analysis can support evaluators in balancing simplicity and specificity of questions in assessing the unique experiences of individuals undergoing complex change. </jats:p

3D ToF-SIMS imaging of polymer multilayer films using argon cluster sputter depth profiling

ToF-SIMS imaging with argon cluster sputter depth profiling has provided detailed insight into the three-dimensional (3D) chemical composition of a series of polymer multilayer structures. Depths of more than 15 μm were profiled in these samples while maintaining uniform sputter rates. The 3D chemical images provide information regarding the structure of the multilayer systems that could be used to inform future systems manufacturing and development. This also includes measuring the layer homogeneity, thickness, and interface widths. The systems analyzed were spin-cast multilayers comprising alternating polystyrene (PS) and polyvinylpyrrolidone (PVP) layers. These included samples where the PVP and PS layer thickness values were kept constant throughout and samples where the layer thickness was varied as a function of depth in the multilayer. The depth profile data obtained was observed to be superior to that obtained for the same materials using alternative ion sources such as C60 n+. The data closely reflected the “as manufactured” sample specification, exhibiting good agreement with ellipsometry measurements of layer thickness, while also maintaining secondary ion intensities throughout the profiling regime. The unprecedented quality of the data allowed a detailed analysis of the chemical structure of these systems, revealing some minor imperfections within the polymer layers and demonstrating the enhanced capabilities of the argon cluster depth profiling technique

Improvements in SIMS continue. Is the end in sight?

Abstract Cluster ion bombardment is at the forefront of current ToF-SIMS research, particularly when examining the feasibility of molecular depth profiling and three-dimensional imaging applications. It has become increasingly clear that secondary ion emission after cluster projectile impact results from a radically different sputtering mechanism than the linear collision cascades that dominate after atomic ion bombardment. The new physics involved with cluster ion impacts dramatically change the traditional approaches toward sample analysis with the SIMS technique. + -all of which are commercially available ion sources. These new properties lead to new rules for traditional static SIMS experiments, provoking new methodologies, and introducing new applications -especially where high mass sensitivity and high-resolution imaging of organic and biological materials are necessary. This paper aims to elucidate recent experimental and theoretical work on these new cluster ion properties and offers insights into how these special properties can be used for future experiments and applications