72 research outputs found
Stability of densities for perturbed Diffusions and Markov Chains
We are interested in studying the sensitivity of diffusion processes or their
approximations by Markov Chains with respect to a perturbation of the
coefficients.Comment: 26 page
Spin relaxation times of donor centers associated with lithium in monoisotopic 28Si
Β© (2016) Trans Tech Publications, Switzerland. We report a detailed study of electron longitudinal and transverse spin relaxation times for Li donors in monoisotopic 28Si over the temperature range 4β20 K using continuous wave and pulsed electron paramagnetic resonance. Comparison of the obtained spin-lattice relaxation times for the states of the isolated donor center and lithium complex LiO showed that due to the presence of orbital degeneracy, relaxation is faster for single lithium than for the LiO complexes with the nondegenerate ground state. For the isolated lithium center in silicon the relaxation is well described by Blume-Orbach process, with the parameters of the spin-orbit coupling ~ 1Β·10-6 meV compare to Orbach process for LiO complex with spin-orbit coupling parameter ~ 1.5Β·10-2 meV
Effect of SnO2 sol on peculiarities of electrochemical deposition and prop-erties of copper coatings on zink, aluminium and their alloy
ΠΠ»ΠΈΡΠ½ΠΈΠ΅ ΠΎΡΠ°ΠΆΠ΄Π΅Π½ΠΈΡ ΡΠ°ΡΡΠΈΡ ΠΊΠΎΠ±Π°Π»ΡΡΠ° Π½Π° ΠΊΠ²Π°Π½ΡΠΎΠ²ΡΠ΅ ΠΏΠΎΠΏΡΠ°Π²ΠΊΠΈ ΠΊ ΠΏΡΠΎΠ²ΠΎΠ΄ΠΈΠΌΠΎΡΡΠΈ ΠΡΡΠ΄Π΅ Π² ΡΠ²ΠΈΡΡΠΈΡΠΎΠ²Π°Π½Π½ΠΎΠΌ CVD Π³ΡΠ°ΡΠ΅Π½Π΅
The use of graphene in electronics requires both an experimental study of the formation of high-quality low-resistance contacts and a deeper understanding of the mechanisms of electron carrier transport in graphene sheets and in the vicinity of metal / graphene interface. In this work, we studied the charge carrier transport in twisted CVD graphene, which was decorated with electrochemically deposited Co particles forming an ohmic contact with the graphene sheet. The temperature and magnetic field dependences of the sheet resistance R(T,B) in the pristine and decorated twisted graphene on silicon oxide substrate are compared. The coexistence of the negative (at magnetic fields with induction B below 1 T) and positive (B higher than 1 T) contributions to the magnetoresistive effect in both types of samples is shown. The R(T,B) dependences are analyzed in fraimwork of the theory of two-dimensional interference quantum corrections to Drude conductivity, taking into account the competition of the contribution from the hopping conduction mechanism. It has been shown that in the studied temperatures range (2-300 K) and magnetic fields (up to 8 T), when describing the transport of charge carriers in the studied samples, it is necessary to take into account at least three interference contributions to the conductivity: from weak localization, intervalley scattering, and breaking of pseudospin chirality, as well as warping of graphene due to thermal fluctuations.ΠΡΠΏΠΎΠ»ΡΠ·ΠΎΠ²Π°Π½ΠΈΠ΅ Π³ΡΠ°ΡΠ΅Π½Π° Π² ΡΠ»Π΅ΠΊΡΡΠΎΠ½ΠΈΠΊΠ΅ ΡΡΠ΅Π±ΡΠ΅Ρ ΠΊΠ°ΠΊ ΡΠΊΡΠΏΠ΅ΡΠΈΠΌΠ΅Π½ΡΠ°Π»ΡΠ½ΠΎΠ³ΠΎ ΠΈΡΡΠ»Π΅Π΄ΠΎΠ²Π°Π½ΠΈΡ ΠΏΡΠΎΡΠ΅ΡΡΠ° ΡΠΎΡΠΌΠΈΡΠΎΠ²Π°Π½ΠΈΡ Π²ΡΡΠΎΠΊΠΎΠΊΠ°ΡΠ΅ΡΡΠ²Π΅Π½Π½ΡΡ
Π½ΠΈΠ·ΠΊΠΎΠΎΠΌΠ½ΡΡ
ΠΊΠΎΠ½ΡΠ°ΠΊΡΠΎΠ², ΡΠ°ΠΊ ΠΈ ΡΠ³Π»ΡΠ±Π»Π΅Π½ΠΈΡ ΠΏΠΎΠ½ΠΈΠΌΠ°Π½ΠΈΡ ΠΌΠ΅Ρ
Π°Π½ΠΈΠ·ΠΌΠΎΠ² ΡΠ»Π΅ΠΊΡΡΠΎΠ½Π½ΠΎΠ³ΠΎ ΠΏΠ΅ΡΠ΅Π½ΠΎΡΠ° Π² ΠΎΠΊΡΠ΅ΡΡΠ½ΠΎΡΡΠΈ ΠΊΠΎΠ½ΡΠ°ΠΊΡΠ° ΠΌΠ΅ΡΠ°Π»Π»/Π³ΡΠ°ΡΠ΅Π½. Π ΡΠ°Π±ΠΎΡΠ΅ ΠΈΡΡΠ»Π΅Π΄ΠΎΠ²Π°Π½ ΡΡΠ°Π½ΡΠΏΠΎΡΡ Π½ΠΎΡΠΈΡΠ΅Π»Π΅ΠΉ Π·Π°ΡΡΠ΄Π° Π² ΡΠ²ΠΈΡΡΠΈΡΠΎΠ²Π°Π½Π½ΠΎΠΌ CVD Π³ΡΠ°ΡΠ΅Π½Π΅, ΠΊΠΎΡΠΎΡΡΠΉ Π΄Π΅ΠΊΠΎΡΠΈΡΠΎΠ²Π°Π½ ΡΠ»Π΅ΠΊΡΡΠΎΡ
ΠΈΠΌΠΈΡΠ΅ΡΠΊΠΈ ΠΎΡΠ°ΠΆΠ΄Π΅Π½Π½ΡΠΌΠΈ ΡΠ°ΡΡΠΈΡΠ°ΠΌΠΈ Co, ΠΎΠ±ΡΠ°Π·ΡΡΡΠΈΠΌΠΈ ΠΎΠΌΠΈΡΠ΅ΡΠΊΠΈΠΉ ΠΊΠΎΠ½ΡΠ°ΠΊΡ Ρ Π³ΡΠ°ΡΠ΅Π½ΠΎΠ²ΡΠΌ ΡΠ»ΠΎΠ΅ΠΌ. Π‘ΠΎΠΏΠΎΡΡΠ°Π²Π»ΡΡΡΡΡ ΡΠ΅ΠΌΠΏΠ΅ΡΠ°ΡΡΡΠ½ΡΠ΅ ΠΈ ΠΌΠ°Π³Π½Π΅ΡΠΎΠΏΠΎΠ»Π΅Π²ΡΠ΅ Π·Π°Π²ΠΈΡΠΈΠΌΠΎΡΡΠΈ ΡΠ»ΠΎΠ΅Π²ΠΎΠ³ΠΎ ΡΠΎΠΏΡΠΎΡΠΈΠ²Π»Π΅Π½ΠΈΡ R(T,B) ΠΈΡΡ
ΠΎΠ΄Π½ΠΎΠ³ΠΎ ΠΈ Π΄Π΅ΠΊΠΎΡΠΈΡΠΎΠ²Π°Π½Π½ΠΎΠ³ΠΎ Β ΡΠ²ΠΈΡΡΠΈΡΠΎΠ²Π°Π½Π½ΠΎΠ³ΠΎ Π³ΡΠ°ΡΠ΅Π½Π° Π½Π° ΠΏΠΎΠ΄Π»ΠΎΠΆΠΊΠ΅ ΠΈΠ· ΠΎΠΊΡΠΈΠ΄Π° ΠΊΡΠ΅ΠΌΠ½ΠΈΡ. ΠΠΎΠΊΠ°Π·Π°Π½ΠΎ ΡΠΎΡΡΡΠ΅ΡΡΠ²ΠΎΠ²Π°Π½ΠΈΠ΅ ΠΎΡΡΠΈΡΠ°ΡΠ΅Π»ΡΠ½ΠΎΠ³ΠΎ (ΠΏΡΠΈ ΠΈΠ½Π΄ΡΠΊΡΠΈΠΈ ΠΌΠ°Π³Π½ΠΈΡΠ½ΠΎΠ³ΠΎ ΠΏΠΎΠ»Ρ Π½ΠΈΠΆΠ΅ 1 Π’Π») ΠΈ ΠΏΠΎΠ»ΠΎΠΆΠΈΡΠ΅Π»ΡΠ½ΠΎΠ³ΠΎ (ΠΈΠ½Π΄ΡΠΊΡΠΈΡ Π²ΡΡΠ΅ 1 Π’Π») Π²ΠΊΠ»Π°Π΄ΠΎΠ² Π² ΠΌΠ°Π³Π½ΠΈΡΠΎΡΠ΅Π·ΠΈΡΡΠΈΠ²Π½ΡΠΉ ΡΡΡΠ΅ΠΊΡ Π² ΠΎΠ±ΠΎΠΈΡ
ΡΠΈΠΏΠ°Ρ
ΠΎΠ±ΡΠ°Π·ΡΠΎΠ². ΠΠ°Π²ΠΈΡΠΈΠΌΠΎΡΡΠΈ R(T,B) Π°Π½Π°Π»ΠΈΠ·ΠΈΡΡΡΡΡΡ Π½Π° ΠΎΡΠ½ΠΎΠ²Π΅ ΡΠ΅ΠΎΡΠΈΠΈ Π΄Π²ΡΠΌΠ΅ΡΠ½ΡΡ
ΠΈΠ½ΡΠ΅ΡΡΠ΅ΡΠ΅Π½ΡΠΈΠΎΠ½Π½ΡΡ
ΠΊΠ²Π°Π½ΡΠΎΠ²ΡΡ
ΠΏΠΎΠΏΡΠ°Π²ΠΎΠΊ ΠΊ ΠΏΡΠΎΠ²ΠΎΠ΄ΠΈΠΌΠΎΡΡΠΈ ΠΡΡΠ΄Π΅ Ρ ΡΡΠ΅ΡΠΎΠΌ ΠΊΠΎΠ½ΠΊΡΡΠ΅Π½ΡΠΈΠΈ Π²ΠΊΠ»Π°Π΄Π° ΠΎΡ ΠΏΡΡΠΆΠΊΠΎΠ²ΠΎΠ³ΠΎ ΠΌΠ΅Ρ
Π°Π½ΠΈΠ·ΠΌΠ° ΠΏΡΠΎΠ²ΠΎΠ΄ΠΈΠΌΠΎΡΡΠΈ. ΠΠΎΠΊΠ°Π·Π°Π½ΠΎ, ΡΡΠΎ Π² ΠΈΠ·ΡΡΠ΅Π½Π½ΠΎΠΉ ΠΎΠ±Π»Π°ΡΡΠΈ ΡΠ΅ΠΌΠΏΠ΅ΡΠ°ΡΡΡ (2β300 Π) ΠΈ ΠΌΠ°Π³Π½ΠΈΡΠ½ΡΡ
ΠΏΠΎΠ»Π΅ΠΉ (Π΄ΠΎ 8Β Π’Π») ΠΏΡΠΈ ΠΎΠΏΠΈΡΠ°Π½ΠΈΠΈ ΡΡΠ°Π½ΡΠΏΠΎΡΡΠ° Π½ΠΎΡΠΈΡΠ΅Π»Π΅ΠΉ Π·Π°ΡΡΠ΄Π° Π² ΠΈΡΡΠ»Π΅Π΄ΠΎΠ²Π°Π½Π½ΠΎΠΌ Π³ΡΠ°ΡΠ΅Π½Π΅ Π½Π΅ΠΎΠ±Ρ
ΠΎΠ΄ΠΈΠΌΠΎ ΡΡΠΈΡΡΠ²Π°ΡΡ Π½Π΅ ΠΌΠ΅Π½Π΅Π΅ ΡΡΠ΅Ρ
ΠΈΠ½ΡΠ΅ΡΡΠ΅ΡΠ΅Π½ΡΠΈΠΎΠ½Π½ΡΡ
Π²ΠΊΠ»Π°Π΄ΠΎΠ² Π² ΠΏΡΠΎΠ²ΠΎΠ΄ΠΈΠΌΠΎΡΡΡ: ΠΎΡ ΡΠ»Π°Π±ΠΎΠΉ Π»ΠΎΠΊΠ°Π»ΠΈΠ·Π°ΡΠΈΠΈ, ΠΌΠ΅ΠΆΠ΄ΠΎΠ»ΠΈΠ½Π½ΠΎΠ³ΠΎ ΡΠ°ΡΡΠ΅ΡΠ½ΠΈΡ ΠΈ Π½Π°ΡΡΡΠ΅Π½ΠΈΡ Ρ
ΠΈΡΠ°Π»ΡΠ½ΠΎΡΡΠΈ ΠΏΡΠ΅Π²Π΄ΠΎΡΠΏΠΈΠ½Π°, Π° ΡΠ°ΠΊΠΆΠ΅ ΠΊΠΎΡΠΎΠ±Π»Π΅Π½ΠΈΠ΅ΠΌ Π³ΡΠ°ΡΠ΅Π½Π° Π²ΡΠ»Π΅Π΄ΡΡΠ²ΠΈΠ΅ ΡΠ΅ΠΏΠ»ΠΎΠ²ΡΡ
ΡΠ»ΡΠΊΡΡΠ°ΡΠΈΠΉ
Systematic errors using a multicomponent activation detector to determine the neutron flux of252Cf fission
Electronic States and Optical Gap of Phosphorus-Doped Silicon Nanocrystals Embedded in a Silica Host Matrix
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