XAFS spectroscopy. I. Extracting the fine structure from the absorption spectra

Three independent techniques are used to separate fine structure from the absorption spectra, the background function in which is approximated by (i) smoothing spline. We propose a new reliable criterion for determination of smoothing parameter and the method for raising of stability with respect to k_min variation; (ii) interpolation spline with the varied knots; (iii) the line obtained from bayesian smoothing. This methods considers various prior information and includes a natural way to determine the errors of XAFS extraction. Particular attention has been given to the estimation of uncertainties in XAFS data. Experimental noise is shown to be essentially smaller than the errors of the background approximation, and it is the latter that determines the variances of structural parameters in subsequent fitting.Comment: 16 pages, 7 figures, for freeware XAFS analysis program, see http://www.crosswinds.net/~klmn/viper.htm

Deconvolution problems in x-ray absorption fine structure

A Bayesian method application to the deconvolution of EXAFS spectra is considered. It is shown that for purposes of EXAFS spectroscopy, from the infinitely large number of Bayesian solutions it is possible to determine an optimal range of solutions, any one from which is appropriate. Since this removes the requirement for the uniqueness of solution, it becomes possible to exclude the instrumental broadening and the lifetime broadening from EXAFS spectra. In addition, we propose several approaches to the determination of optimal Bayesian regularization parameter. The Bayesian deconvolution is compared with the deconvolution which uses the Fourier transform and optimal Wiener filtering. It is shown that XPS spectra could be in principle used for extraction of a one-electron absorptance. The amplitude correction factors obtained after deconvolution are considered and discussed.Comment: 6 two-column pages, 5 eps figures; submitted to J. Phys.: Appl. Phy