1 research outputs found
Single Event Effects Assessment of UltraScale+ MPSoC Systems under Atmospheric Radiation
The AMD UltraScale+ XCZU9EG device is a Multi-Processor System-on-Chip
(MPSoC) with embedded Programmable Logic (PL) that excels in many Edge (e.g.,
automotive or avionics) and Cloud (e.g., data centres) terrestrial
applications. However, it incorporates a large amount of SRAM cells, making the
device vulnerable to Neutron-induced Single Event Upsets (NSEUs) or otherwise
soft errors. Semiconductor vendors incorporate soft error mitigation mechanisms
to recover memory upsets (i.e., faults) before they propagate to the
application output and become an error. But how effective are the MPSoC's
mitigation schemes? Can they effectively recover upsets in high altitude or
large scale applications under different workloads? This article answers the
above research questions through a solid study that entails accelerated neutron
radiation testing and dependability analysis. We test the device on a broad
range of workloads, like multi-threaded software used for pose estimation and
weather prediction or a software/hardware (SW/HW) co-design image
classification application running on the AMD Deep Learning Processing Unit
(DPU). Assuming a one-node MPSoC system in New York City (NYC) at 40k feet, all
tested software applications achieve a Mean Time To Failure (MTTF) greater than
148 months, which shows that upsets are effectively recovered in the processing
system of the MPSoC. However, the SW/HW co-design (i.e., DPU) in the same
one-node system at 40k feet has an MTTF = 4 months due to the high failure rate
of its PL accelerator, which emphasises that some MPSoC workloads may require
additional NSEU mitigation schemes. Nevertheless, we show that the MTTF of the
DPU can increase to 87 months without any overhead if one disregards the
failure rate of tolerable errors since they do not affect the correctness of
the classification output.Comment: This manuscript is under review at IEEE Transactions on Reliabilit