Optimal static and dynamic recycling of defective binary devices

The binary Defect Combination Problem consists in finding a fully working subset from a given ensemble of imperfect binary components. We determine the typical properties of the model using methods of statistical mechanics, in particular, the region in the parameter space where there is almost surely at least one fully-working subset. Dynamic recycling of a flux of imperfect binary components leads to zero wastage.Comment: 14 pages, 15 figure

Optimal combinations of imperfect objects

We address the question of how to make best use of imperfect objects, such as defective analog and digital components. We show that perfect, or near-perfect, devices can be constructed by taking combinations of such defects. Any remaining objects can be recycled efficiently. In addition to its practical applications, our `defect combination problem' provides a novel generalization of classical optimization problems.Comment: 4 pages, 3 figures, minor change