4 research outputs found
High-Frequency Capacitance Measurements for Monitoring EOT of Thin Gate Dielectrics
- Author
- Publication venue
- 'SAGE Publications'
- Publication date
- Field of study
No full textDefects in Logic Circuits and their Test Implications
- Author
- Publication venue
- 'Springer Science and Business Media LLC'
- Publication date
- 01/01/2007
- Field of study
No full textQualification Tests for Components and Assemblies
- Author
- A. Birolini
- A. Birolini
- A. Bobbio
- A. Bondavalli
- A. Deutsch
- A. Kossow
- A.A. Gallo
- A.D.S. Carter
- A.F. Myers
- A.J Goor van de
- A.K. Somani
- ASM
- B. Murari
- B. Umiker
- B.N. Ellis
- C. Diaz
- C. Lea
- C. Lindemann
- C.M. Krishna
- D. Beaudry
- D. Keymeulen
- D.P. Siewiorek
- E. A. Irland
- E. Amerasekera
- E. Lenz
- E.E. Lewis
- E.F. Moore
- E.R. Hnatek
- F. Beichelt
- F. Belzunce
- F. Jensen
- F. Reynolds
- G. Ciardo
- G. Grossmann
- G. Mattana
- G. Srinivasan
- G. Taguchi
- G.A. Peters
- G.J. Glasser
- G.R. Redinbo
- G.S. Hura
- H-Y. Lin
- H. Ascher
- H. Choi
- H. Jaeger
- Item
- J. Braband
- J. Gymayr
- J. Neumann Von
- J. Reiner
- J.A. Collins
- J.A. “ Carrasco
- J.B. Dugan
- J.D. Esary
- J.J. Goedbloed
- J.R. Gardner
- J.X. Wang
- K. Sarkadi
- K.F. Schuegraf
- L. Lantz
- L. Tomek
- L. Xing
- M. Agarwal
- M. Ajmone-Marsan
- M. Berg
- M. Herrmann
- M. Ohring
- M. Pecht
- M. Tullmin
- M.A. Miner
- M.G. Pecht
- M.J. Chandra
- M.L. Roush
- NSWC-07
- O. Zinke
- P. Brambilla
- P. Jacob
- P. Jud
- P.D.T. O'Connor
- R. Billinton
- R. Darveause
- R. Rajusman
- R. Sahner
- R.C.-Y. Fung
- R.D. Barer
- R.E. Barlow
- R.E. Bryant
- R.F. Powell
- RAC
- Relex
- S. Arunkumar
- S. Freddi
- S. Glasstone
- S. Hellström
- S. Mitra
- S.S. Manson
- T. Cluzeau
- T. Feo
- T. Luo
- T.I. Bajenescu
- V.K. Bansal
- V.R. Prasad
- W. Boxleitner
- W. Hirschi
- W. Kuo
- W. Schneeweiss
- W.J. Padgett
- Publication venue
- 'Springer Science and Business Media LLC'
- Publication date
- Field of study
No full textQuality and Reliability Assurance During the Production Phase (Basic Considerations)
- Author
- A. Benso
- A. Costes
- A. Dubi
- A. Fries
- A. Kossow
- A. Kullstam
- A. Villemeur
- A.D.S. Carter
- A.F. Myers
- A.G. Glen
- A.J Goor van de
- A.K. Somani
- A.S. Tenenbaum
- ASM
- B. Murari
- B. Umiker
- B.L. Retterer
- B.N. Ellis
- B.V. Gnedenko
- B.V. Gnedenko
- C-Y. Huang
- C. Lea
- C. Lindemann
- C. Lloyd
- C. Robach
- C.-M. Liao
- C.C. Jane
- C.J. Colbourn
- C.M. Krishna
- D. Avresky
- D. Keymeulen
- D.J. Reifer
- D.L Parnas
- D.L. Lanning
- D.P. Siewiorek
- D.R. Shier
- D.S. Peck
- D.W. Obal
- E Manzi
- E. A. Irland
- E. Amerasekera
- E. Lenz
- E.E. Lewis
- E.F. Moore
- E.J. McCluskey
- E.O. Costa
- E.R. Hnatek
- F. Jensen
- F. Moskowitz
- F. Reynolds
- G. Deconick
- G. Garriba
- G. Grossmann
- G. Mattana
- G. Srinivasan
- G. Taguchi
- G.A. Peters
- G.F. Hughes
- G.R Redimbo
- G.R. Redinbo
- G.S. Hura
- H-Y. Lin
- H. Deriennic
- H. Frank
- H. Jaeger
- H. Wang
- H.E. Ascher
- H.Y. Tu
- I. Fakhre-Zakeri
- I. Kovalenko
- I.A. Ushakov
- I.H. Khamis
- Item
- J. Braband
- J. Endrenyi
- J. Gymayr
- J. Kreimer
- J. MØltoft
- J. Neumann Von
- J. Reiner
- J. Savir
- J. Sergent
- J.A. Collins
- J.A. Stankovic
- J.A. “ Carrasco
- J.B. Dugan
- J.D. Esary
- J.D. Hall
- J.D. Musa
- J.E. Vinson
- J.X. Wang
- K. Fitzgerald
- K. Kanoun
- K. Kim
- K. Sarkadi
- K.D. Wagner
- K.F. Schuegraf
- K.V. Lee
- K.W. Gaede
- K.W. Lee
- L. Lantz
- L. Tomek
- L. Xing
- L. Xing
- L.B. Page
- L.H. Crow
- M-H Chen
- M. Abramovici
- M. Agarwal
- M. Finkelstein
- M. Herrmann
- M. Malhotra
- M. Ohring
- M. Pecht
- M. R. Garzia
- M. Shaked
- M. Smotherman
- M. Tullmin
- M. Walzer
- M.-S. Lin
- M.A. Miner
- M.C. Pagès
- M.G. Pecht
- M.J. Chandra
- M.L. Roush
- M.L. Shooman
- M.R. Ed. Lyu
- N. Fenton
- N. Metropolis
- N. Oh
- N. Oh
- N. Ye
- N.D. Singpurwalla
- N.F. Schneidewind
- N.G. Leveson
- NSWC-07
- O. Sinanoglu
- O. Zinke
- P. Jacob
- P. Jud
- P. Jääskeläinen
- P.A. Lee
- P.D.T. O'Connor
- P.K. Lala
- R-H Hou
- R. Albert
- R. Brinkmann
- R. Chillareg
- R. Darveause
- R. Grady
- R. Rajusman
- R. Sahner
- R.A. Evans
- R.A. Evans
- R.A. Rees
- R.C.-Y. Fung
- R.D. Barer
- R.E. Barlow
- R.E. Bryant
- R.E. Stein
- R.F. Powell
- R.G. Bennetts
- R.J.K. Wassink
- R.P. Prasad
- RAC
- RAC
- Relex
- S-L. Teng
- S. Arunkumar
- S. Brocklehurst
- S. Freddi
- S. Glasstone
- S. Mitra
- S. Satisatian
- S. Yamada
- S.M. Lee
- S.S. Manson
- S.Y. Kuo
- T. Cluzeau
- T. Feo
- T. Jayachandran
- T. Luo
- T. Nakagawa
- T. Zhihua
- V. Chan
- V. Solberg
- V.K. Bansal
- V.R. Prasad
- W. A. Shewhart
- W. Aiello
- W. Kuo
- W. Kuo
- W. Nelson
- W. Schneeweiss
- W. Schneeweiss
- W.C. Yeh
- W.J. Padgett
- W.Q. Meeker
- W.R. Simpson
- Y. Le Traon
- Y. Ou
- Y. Pan
- Y. Ren
- Y.-K. Lin
- Z. Zheng
- Publication venue
- 'Springer Science and Business Media LLC'
- Publication date
- Field of study
No full text
