1,3-Bis(4-meth­oxy­benz­yl)-6-methyl­pyrimidine-2,4(1H,3H)-dione

The title compound, C21H22N2O4, was prepared by reaction of 6-methyl­pyrimidine-2,4(1H,3H)-dione and 1-chloro­methyl-4-meth­oxy­benzene. In the title mol­ecule, the central pyrimidine ring forms dihedral angles of 62.16 (4) and 69.77 (3)° with the two benzene rings. In the crystal, weak inter­molecular C—H⋯O hydrogen bonds link the mol­ecules into chains

6-Benz­yloxy-2-phenyl­pyridazin-3(2H)-one

In the title compound, C17H14N2O2, the central pyridazine ring forms dihedral angles of 47.29 (5) and 88.54 (5)° with the benzene rings, while the dihedral angle between the benzene rings is 62.68 (6)°. In the crystal, molecules are linked by two weak C—H⋯O hydrogen bonds and three weak C—H⋯π inter­actions

Surface Morphological and Nanomechanical Properties of PLD-Derived ZnO Thin Films

This study reports the surface roughness and nanomechanical characteristics of ZnO thin films deposited on the various substrates, obtained by means of atomic force microscopy (AFM), nanoindentation and nanoscratch techniques. ZnO thin films are deposited on (a- and c-axis) sapphires and (0001) 6H-SiC substrates by using the pulsed-laser depositions (PLD) system. Continuous stiffness measurements (CSM) technique is used in the nanoindentation tests to determine the hardness and Young’s modulus of ZnO thin films. The importance of the ratio (H/Efilm) of elastic to plastic deformation during nanoindentation of ZnO thin films on their behaviors in contact-induced damage during fabrication of ZnO-based devices is considered. In addition, the friction coefficient of ZnO thin films is also presented here