20 research outputs found

    Patterning graphene nanoribbons using copper oxide nanowires

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    Site-controlled InP/GaInP quantum dots emitting single photons in the red spectral range Appl. Phys. Lett. 100, 091109 (2012) Micromagnet structures for magnetic positioning and alignment J. Appl. Phys. 111, 07B312 (2012) Influence of low anisotropy inclusions on magnetization reversal in bit-patterned arrays J. Appl. Phys. 111, 033924 (2012) Additional information on J. Appl. Phys. The formation of Al nanocrystals from an amorphous Al 92 Sm 8 alloy involves kinetic phenomena with very different characteristic length and timescales, including initial nucleation and later growth and coarsening. Insight into these processes can be derived from the evolution of the sizes of nanocrystals as a function of time. Synchrotron small angle x-ray scattering (SAXS) experiments provide information about the evolution of the nanocrystal size distribution, particularly at times after nucleation has reached saturation. Accurately interpreting the distribution of intensity measured using SAXS requires a nanoparticle model consisting of nanocrystalline core of pure Al surrounded by a shell enriched in Sm. With this approach, statistical parameters derived from SAXS are independent of detailed assumptions regarding the distribution of Sm around the nanocrystals and allow the maximum radius of nanocrystals within the distribution to be determined unambiguously. Sizes determined independently using transmission electron microcopy are in excellent agreement with the SAXS results. The maximum radius obtained from SAXS is proportional to the cube root of time at large sizes and long times, consistent with a coarsening model. The diffusivity of Al within the Al-Sm alloy is obtained from a quantitative analysis of the coarsening process. Further analysis with this diffusivity and a particle growth model provides a satisfactory account for the particle size evolution at early times before the kinetic transition to coarsening. V C 2012 American Institute of Physics. [http://d

    T.-C.: Determination of Phonon Dispersion from X-ray Transmission Scattering: the Example of Silicon.

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    A beam of monochromatic synchrotron x-ray incident on a silicon wafer creates a rich intensity pattern behind the wafer that reflects the cross section of scattering by thermally populated phonons. A least-squares fit of the patterns based on a lattice dynamics calculation yields the phonon dispersion relations over the entire reciprocal space. This simple and efficient method is suitable for phonon studies in essentially all materials, and complements the traditional neutron scattering technique. PACS numbers: 78.70.Ck, 63.20.Dj Phonons are the fundamental quanta of lattice vibration in a solid. They play a critical role in phenomena such as superconductivity and many types of phase transitions, and are the basis for the acoustic, thermal, elastic, and infrared properties of solids Although intensity distribution of x-ray scattering by thermally populated phonons has been long recognized as a possible measure of phonon properties Our experiment was performed at the undulator beam line of Sector 33 (University, Industry, and National Laboratory Collaborative Access Team) at the Advanced Photon Source. A transmission Laue geometry was employed, in which a 28 keV beam was sent at normal incidence through commercial Si wafers with a thickness of 0.5 mm. An image plate positioned behind the sample was used to record the images with an exposure time of ϳ10 s each. The incident beam was polarized in the horizontal direction. Data were taken with the sample in air, in a helium atmosphere, or in vacuum with similar results. The data shown below were taken with the sample in air. Figures 1(a) and 1(b) are experimental pictures of Si Each point in the picture corresponds to a planar projection of a unique momentum transfer q on the Ewald sphere. Because each unit cell of Si contains two atoms, there can 0031-9007͞99͞83(16)͞3317(3)$15.0
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