2 research outputs found
Scattering of electrons by ionized impurities in semiconductors: quantum-mechanical approach to third body exclusion
- Author
- A.Q. Sarker
- A.S. Davydov
- B.E. Sernelius
- B.K. Ridley
- B.K. Ridley
- C. Jacaboni
- C. Jacaboni
- C. Jacoboni
- Ch. Kopf
- D. Bohm
- D. Chattopadhyay
- D. Querlioz
- D.V. Pozdnyakov
- Dmitry Pozdnyakov
- E. Pop
- E.J. Moore
- E.M. Conwell
- F. Kuchar
- G. Baccarani
- G. Kaiblinger-Grujin
- G. Masetti
- G. Masetti
- G.B. Stringfellow
- H. Brooks
- H. Kosina
- I.Y. Yanchev
- J.R. Meyer
- J.R. Meyer
- M. Sotoodeh
- M.B. Mensky
- M.V. Fischetti
- N.A. Poklonski
- N.S. Mansour
- R.G. Newton
- S.S. Li
- S.T. Pantelides
- S.T. Pantelides
- S.T. Pantelides
- T.G. Roer Van de
- V.I. Fistul
- V.L. Bonch-Bruevich
- V.M. Ivaschenko
- Publication venue
- 'Springer Science and Business Media LLC'
- Publication date
- Field of study
No full textHETEROMETALLIC ALUMINIUM COMPOUNDS: CLASSIFICATION AND ANALYSIS OF CRYSTALLOGRAPHIC AND STRUCTURAL DATA
- Author
- Albrecht M.
- Allegra G.
- Atwood D.A.
- Atwood J.L.
- Atwood J.L.
- Atwood J.L.
- Bachmann B.
- Barron A.B.
- Belskii V.K.
- Belskii V.K.
- Belskii V.K.
- Belskii V.K.
- Belskii V.K.
- Belskii V.K.
- Bolotina N.B.
- Boncella J.M.
- Brauer D.J.
- Brosset C.
- Bruno J.W.
- Burlitch J.M.
- Burns J.H.
- Busch M.A.
- Butts S.B.
- Böck S.
- Calderazzo F.
- Cesari M.
- Cesari M.
- Churchill M.R.
- Churchill M.R.
- Churchill M.R.
- Corradini P.
- Cotton F.A.
- Cotton F.A.
- Cotton F.A.
- Dahlke P.
- Del Piero G.
- Domesle R.
- Ellison R.D.
- Erber G.
- Erber G.
- Erber G.
- Erber G.
- Erber G.
- Erker G.
- Erker G.
- Erofeev A.B.
- Evans W.J.
- Evans W.J.
- Evans W.J.
- Evans W.J.
- Evans W.J.
- Evans W.J.
- Ewans W.J.
- Faggiani R.
- Ferey G.
- Fischer J.
- Fleischer T.
- Forder R.A.
- Fourguet J.L.
- Fourguet J.L.
- Fourguet J.L.
- Frank W.
- Gash A.G.
- Gaudet M.V.
- Geller S.
- Gerteis R.L.
- Ghazi S.U.
- Gibson V.C.
- Girolami G.S.
- Gornitzka H.
- Gravereau P.
- Grimmett D.L.
- Guggenberger L.J.
- Guilard R.
- Gunko Y.K.
- Gunko Y.K.
- Hake D.
- Hausen H.D.
- Hawthorne F.C.
- Heine A.
- Hemon A.
- Hemon A.
- Herzog A.
- Hoppe R.
- Hunter F.M.
- Ibers J.A.
- Jacaboni C.
- Jacobs H.
- Jacobs H.
- Janik J.F.
- Johansson G.
- Karsch H.H.
- Karsch H.H.
- Kim N.E.
- Klabunde U.
- Klein H.F.
- Knjashanski S.Y.
- Knjazhanski S.Y.
- Knjazhanskij S.Y.
- Knop O.
- Kopf J.
- Kopf J.
- Krüger C.
- Krüger C.
- Kumar R.
- Labinger J.A.
- Lamotte J.
- Laumanns R.
- Launay J.M.
- Lehmkuhl G.
- Lehmkuhl H.
- Lenhard W.
- Lobkovskii E.B.
- Lobkovskii E.B.
- Lobkovskii E.B.
- Lobkovskii E.B.
- Lobkovskii E.B.
- Lobkovskii E.B.
- Lukehart C.M.
- Mayer J.M.
- McNeese T.J.
- Means C.M.
- Meese-Marktscheffel J.A.
- Meese-Marktscheffel J.A.
- Meese-Marktscheffel J.A.
- Melnik M.
- Moliner M.
- Nouet J.
- Perego G.
- Perenthaler E.
- Peters K.
- Petersen R.B.
- Petrie M.A.
- Pluth J.J.
- Power M.B.
- Probst T.
- Protasiewicz J.D.
- Pörschke K.R.
- Reetz M.T.
- Rettig S.J.
- Rimsky A.
- Robinson G.H.
- Rodesiler P.F.
- Rogers R.D.
- Rominger F.
- Saboonchian V.
- Sassmannshausen J.
- Schaffers K.I.
- Schmid G.
- Schmidbauer H.
- Schmidbaur H.
- Schmidbaur H.
- Schmidbaur H.
- Schneider J.J.
- Shearer M.M.
- Sirio C.
- Sisov A.l.
- Sisov A.l.
- Sizov A.l.
- Sizov A.l.
- Sklar N.
- Skupinski W.A.
- Staffel T.
- Staffel T.
- Struchkov T.Y.
- Takahashi T.
- Tanner P.S.
- Tessier-Youngs C.
- Tessier-Youngs C.
- Thewalt U.
- Thewalt U.
- Trayanov S.
- Tressaud A.
- Tripathi U.M.
- Trojanov S.I.
- Trojanov S.I.
- Troyanov S.I.
- Troyanov S.I.
- Troyanov S.I.
- Turner R.W.
- Turner R.W.
- Uhl W.
- Uhl W.
- Uhl W.
- Uhl W.
- Veith M.
- Veith M.
- Veith M.
- Viebahn W.
- Von der Mühll R.
- Wang R.
- Watson P.L.
- Waymouth R.M.
- Waymouth R.M.
- Waymouth R.W.
- Weininger M.S.
- Wong E.
- Wu J.
- Yamamoto H.
- Yang H.
- Publication venue
- 'Walter de Gruyter GmbH'
- Publication date
- Field of study
No full text
