Thoughts about the optimum data acquisition geometry and time resolution of monochromatic beam x-ray diffraction microscopy experiments

International audienceSo far, 3D X-ray diffraction microscopy (3DXRD) and X-ray diffraction contrast tomography (DCT) experiments have typically been performed in forward scattering geometry, the detector intercepting diffraction cones up to limited opening angles below 30°. The extension of the current synchrotron–based methodology towards 3D orientation mapping of deformed microstructures with down to (sub-)micrometer spatial resolution will require a reduction of the pixel and hence sample size by one order of magnitude. This in turn relaxes the need for high energy beams and opens interesting possibilities for new acquisition geometries, taking advantage of improved spatial resolution and strain sensitivity at high diffraction angles. First results obtained in this acquisition geometry will be discussed and a comparison to polychromatic micro-diffraction experiments is drawn

Reverse identification of short−long crack threshold fatigue stress intensity factors from plain fretting crack arrest analysis

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PART 1‐Casting and Solidification‐Pore Characterization in a Model Cast Aluminum Alloy and its Quantitative Relation to Fatigue Life Studied by Synchrotron X‐Ray Microtomography

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In-Situ 3 D Observation of Short Crack Propagation in Titanium Alloys

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Influence de l'etat de surface sur la prediction de l'amorcage des fissures en fretting

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DURABILITY AND OPTIMIZATION OF STRUCTURAL MATERIALS-Troisieme partie-Caracterisation-Development of a non destructive characterization technique for the 3D investigation of micro-heterogenous

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Deformation of a Metallic Foam Studied by X-Ray Computed Tomography and Finite Element Calculations

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Etude par microtomographie de la nocivité de la porosité sur la tenue en fatigue de pièces en Al-Si9Cu3

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Damage assessment in metallic structural materials using high resolution synchrotron X-ray tomography

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Damage assessment in metallic structural materials using high resolution synchrotron X-ray tomography

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