1 research outputs found
Product Dimensional Metrology and Pattern Defect Inspection
- Author
- B Singh
- CW See
- D Nyyssonen
- D Nyyssonen
- D Nyyssonen
- D Nyyssonen
- D Nyyssonen
- D Rugar
- D Vukobratovich
- DC Joy
- DC Joy
- DG Seiler
- DJ Coleman
- DL Cavan
- EC Teague
- F Robb
- G Binnig
- G Binnig
- G Matsuoka
- GQ Xiao
- GS Kino
- H Bengtsson
- HA Khoury
- HC Pfeiffer
- HK Wickramasinghe
- HK Wickramasinghe
- JC Shaw
- JG Hartley
- JL Berman
- JM Eastman
- JR Dralla
- JS Batchelder
- JT LaComb
- JW Dockrey
- K Lee
- M Davidson
- M Davidson
- M Levine
- M Petran
- MG Rosenfield
- MP Davidson
- MT Postek
- MT Postek
- MT Postek
- MT Postek
- MT Postek
- MT Postek
- NG Wu
- NikonPrecision Inc
- OC Wells
- P Burrgraaf
- PJ Lawson
- R Wallace
- RL Fusek
- S Billat
- S Kudva
- S Stalnaker
- SG Utterback
- SSC Chim
- T Wilson
- TF Hasan
- TR Corle
- TR Corle
- TR Groves
- V Nagaswami
- V Ramakrishna
- W Steel
- Y Martin
- Publication venue
- 'Springer Science and Business Media LLC'
- Publication date
- 01/01/1993
- Field of study