Crystallographic techniques and data for transmission electron microscopy of zirconium.

The crystallography of hexagonal close packed metals is discussed briefly in terms of the four-axis hexagonal reference basis and the Miller-Bravais notation which are used throughout the report. Electron diffraction problems are treated with reference to the four-axis hexagonal reciprocal lattice rather than the more usual three-axis hexagonal system. Using these concepts, analysis of electron diffraction spot and Kikuchi patterns is illustrated and applied to orientation and dislocation Burgers vector determinations. Computed values of interplanar spacings, interplanar angles, angles between directions, and extinction distances for zirconium are listed

Calibration of a JSEM-200 electron microscope with a magnetic specimen pole-piece.

This report contains the results of a detailed calibration of the JSEM-200 scanning transmission electron microscope operated with a magnetic specimen pole-piece as supplied by JEOL (Japan Electron Optics Laboratory) Ltd. The microscopy, in this configuration, permits convenient examination of ferromagnetic specimens in the side-entry goniometer specimen stage with a point-to-point resolution better than 2.0 nm

Characterisation of neutron irradiation damage in zirconium alloys - a 'round robin' experiment.

The nature of the damage structure in the neutron-irradiated zirconium specimens supplied as part of an international 'Round Robin1 experiment has been studied using transmission electron microscopy. The damage structure consists entirely of a/3 dislocation loops and no evidence has been found for c_ component loops. Both vacancy and interstitial loops were found in specimens where inside/outside contrast analysis was possible. Quantitative measurements of loop size distributions and loop concentrations are reported. All specimens exhibited corduroy contrast to varying degrees

Calibration of a JSEM-200 electron microscope.

The results of a detailed calibration of a JSEM-200 scanning transmission electron microscope are reported. Two types of measurements have been made: (a) calibration of the various parameters associated with scanning transmission (STEM) imaging, and (b) calibration of the usual parameters required for analytical diffraction contrast experiments in the conventional transmission mode (CTEM). The report also contains a detailed discussion of the various STEM imaging modes and the microscope settings necessary to obtain the required image