A spin- and angle-resolving photoelectron spectrometer

A new type of hemispherical electron energy analyzer that permits angle and spin resolved photoelectron spectroscopy has been developed. The analyzer permits standard angle resolved spectra to be recorded with a two-dimensional detector in parallel with spin detection using a mini-Mott polarimeter. General design considerations as well as technical solutions are discussed and test results from the Au(111) surface state are presented

Angle-Resolved Environmental X-Ray Photoelectron Spectroscopy: A New Laboratory Setup for Photoemission Studies at Pressures up to 0.4 Torr

The paper presents the development and demonstrates the capabilities of a new laboratory-based environmental X-ray photoelectron spectroscopy system incorporating an electrostatic lens and able to acquire spectra up to 0.4 Torr. The incorporation of a two-dimensional detector provides imaging capabilities and allows the acquisition of angle-resolved data in parallel mode over an angular range of 14° without tilting the sample. The sensitivity and energy resolution of the spectrometer have been investigated by analyzing a standard Ag foil both under high vacuum (10−8 Torr) conditions and at elevated pressures of N2 (0.4 Torr). The possibility of acquiring angle-resolved data at different pressures has been demonstrated by analyzing a silicon/silicon dioxide (Si/SiO2) sample. The collected angle-resolved spectra could be effectively used for the determination of the thickness of the native silicon oxide layer

STM and XPS characterization of zinc phthalocyanine on InSb(001)

Zinc phthalocyanine (ZnPc) adsorbed on the InSb(0 0 1)-c(8 x 2) surface has been studied by scanning tunneling microscopy (STM) and X-ray photoelectron spectroscopy (XPS). Coverages from sub-monolayer to monolayer (ML) have been investigated. The molecules form ordered structures on the reconstructed rows of the surface with the molecular plane parallel to the surface. A change in the electronic structure between the sub-ML and higher coverages has been observed. Moreover, in order to study the influence of annealing on the electronic and geometric structures, the samples have been heated to elevated temperatures (about 640 K). In addition, multi-layer ZnPc films have been characterized by XPS measurements