A high resolution magnetic spectrograph for ion beam analysis

A magnetic spectrograph especially designed for interface and thin film analysis has been installed at the 6.5 MV tandem accelerator of the University of Utrecht. It is provided with a Wien filter, so that both the mass and the charge of the ions arriving in the focal plane is determined. In the focal plane a two-dimensional position-sensitive detector is used to obtain spectra with resolved energy along one axis, and resolved angles (perpendicular to the scattering plane) along the other axis, A special bellows construction allows the spectrograph to be rotated over an angular range of 120 degrees while maintaining the ultra-high vacuum conditions. The first results of RBS and ERD measurements are presented