17 research outputs found
Study of multilayered SiGe semiconductor structures by X-ray diffractometry, grazing-incidence X-ray reflectometry, and secondary-ion mass spectrometry
No full textVerification of the Hypothesis on the Thermoelastic Nature of Deformation of a (0001)GaN Layer Grown on the Sapphire a-Cut
No full text
Matched X-Ray Reflectometry and Diffractometry of Super-Multiperiod Heterostructures Grown by Molecular Beam Epitaxy
No full textMicrowave Impedance of Thin-Film Superconductor–Normal Metal Hybrid Structures with a High Conductivity Ratio
No full textNew Hybrid Material Based on Multiwalled Carbon Nanotubes Decorated by Rhenium-Tungsten Nanodendrites
No full text
