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3 research outputs found
Influence of the organic layer thickness in (Metal-Assisted) secondary ion mass spectrometry using Ga+ and C60+ projectiles
Author
A. A. Galuska
A. Benninghoven
+34 more
A. Benninghoven
A. Brunelle
A. Delcorte
A. Delcorte
A. Delcorte
A. Delcorte
A. Delcorte
A. Delcorte
A. Delcorte
A. Delcorte
A. F. Altelaar
A. F. M. Altelaar
A. Heile
A. M. Leeson
B. Hagenhoff
C. Stoermer
D. C. Muddiman
G. Gillen
I. J. Amster
I. Katakuse
I. S. Gilmore
I. V. Blestos
J. E. Whitten
J. Kordys
K. J. Taylor
K. Norrman
L. A. McDonnell
M. Fallavier
M. Pattabi
N. Wehbe
P. Sjovall
S. Rajagopalachary
S. Tamaki
W. Begemann
Publication venue
'Elsevier BV'
Publication date
Field of study
Full text link
Crossref
Determination of molecular weight and composition of a perfluorinated polymer from fragment intensities in time-of-flight secondary ion mass spectrometry
Author
Alfred. Benninghoven
Blestos I. V.
+16 more
Bletsos I. V.
Bletsos I. V.
Bletsos I. V.
Briggs D
Briggs D.
Briggs D. SIA
Clark D. T.
David E. Fowler
Dieter. VanLeyen
Figure
Lub J.
Patton J.
Robert D. Johnson
Secondary Ion Mass Spectrometry
Steffens P.
University
Publication venue
'American Chemical Society (ACS)'
Publication date
Field of study
No full text
Crossref
Characterization of the surface composition of alkyl bonded phases under reversed-phase liquid chromatographic conditions using homologues of alkanoate and perfluoroalkanoate esters as solute probes
Author
Blestos I. V.
Bletsos I. V.
+55 more
Bletsos I. V.
Bletsos I. V.
Boehm R. E.
Briggs D
Briggs D.
Briggs D. SIA
Clark D. T.
Colin H.
Dabrowskl A.
Department of Chemistry and Biochemistry
Dorsey J. G.
Dorsey J. G.
Facility
Gangoda E.
Gilpin R. K.
Gilpin R. K.
Gilpin R. K.
Hemetsberger H.
Jaroniec M.
Jaroniec M.
Jaroniec M.
Jaroniec M.
Jaroniec M.
Jaroniec M.
Jaroniec M.
Jaronlec M.
Johnson B. P.
Karger B. L.
Krafft P.
Krstulovic A. M.
Lub J.
M. Jaroniec
Martlre D. E.
Martlre D. E.
Martlre D. E.
Martlre D. E.
Martlre D. E.
Martlre D. E.
McCormick R. M.
Melander W. R.
Melander W. R.
Patton J.
Permanent
Present
R. K. Gilpin
S. Lin
Sadek P. C.
Scott R. P. W.
Secondary Ion Mass Spectrometry
Snyder L. R.
Snyder L. R.
Snyder L. R.
Steffens P.
Yang S. S.
Yang S. S.
Publication venue
'American Chemical Society (ACS)'
Publication date
Field of study
No full text
Crossref