Universal Electric and Magnetic Field Analyzer System

Near-field probing is often used to determine the sources and coupling paths of an electromagnetic interference problem above a printed circuit board or integrated circuits chip. A wideband universal field analyzer was developed in order to measure circularly and linearly polarized magnetic fields and total electric field in a rapid sequence using a single probe design

Orthogonal Loops Probe Design and Characterization for Near-Field Measurement

Near-field probes are often used to measure the electric and magnetic fields above a printed circuit board in order to identify the sources and coupling paths of an electromagnetic interference (EMI) problem. It is the objective of this paper to propose a rapid E-, Hx- Hy- and circular H-fields measurement using an orthogonal loops probe design. The effects of this probe are analyzed using full-wave simulations and measurements

Universal electric and magnetic fields analyzer system

Near-field probing is often used to measure the electric and magnetic fields above a printed circuit board (PCB) or integrated circuits (IC) chip in order to identify the sources and coupling paths of an electromagnetic interference (EMI) problem. A wideband universal field analyzer was designed, built and tested in this thesis. The system is able to provide fast field scanning over a wide frequency range in lieu of its capabilities to measure multiple field components using a single probe design. Central to the system operation is the phase-shifting concept that provides wideband and wide- range phase-shifting. The complete universal field analyzer would consist of the probe and the electronics system. This thesis would focus on the realization of the electronics system --Abstract, page iii