CORE
🇺🇦
make metadata, not war
Services
Services overview
Explore all CORE services
Access to raw data
API
Dataset
FastSync
Content discovery
Recommender
Discovery
OAI identifiers
OAI Resolver
Managing content
Dashboard
Bespoke contracts
Consultancy services
Support us
Support us
Membership
Sponsorship
Community governance
Advisory Board
Board of supporters
Research network
About
About us
Our mission
Team
Blog
FAQs
Contact us
Filters
1 research outputs found
On the investigation of dopant boundaries in silicon device structures by means of SEM-EBIC
Author
Amarray
Antoniadis
+46 more
Bach
Beall
Blumtritt
Canali
Davies
Devaney
Dizman
Donolato
Donolato
Donolato
Dressendorfer
Erzgräber
Everhart
Frabboni
Georges
Herserer
Joens
Kato
Kittler
Koellen
Leamy
Marcus
Marten
Muralt
Muralt
Okumura
Posdziech
Possin
Possin
Rehme
Ruge
Schick
Schick
Schink
Schink
Selberherr
Selezneva
Sheng
Sugano
Tseng
Van Roosebroeck
Werner
Werner
Werner
Wilson
Wu
Publication venue
'Wiley'
Publication date
Field of study
No full text
Crossref