503 research outputs found
Material damage in TBCs by a synthetic CMAS and the non-destructive detection:-An exploration via a single crystal YSZ-
More recently a new type of damage has been pronounced in thermal barrier coatings (TBCs) by calcium-magnesium-alumino-silicates (CMAS) from ingestion of siliceous minerals under certain operating conditions, based on synthetic material in Table 1. In order to understand material aspect of CMAS damage, a study on material interaction between a synthetic CMAS and a single crystal yttria-stabilized zirconia (YSZ) was studied in this work. Here, the effect of crystallographic orientation on the interaction was also investigated. The experimental works clearly showed that the material interaction between the CMAS and YSZ was significant, resulting in the change in microstructural morphology(Fig. 1(a)). The extent of interaction depended on the crystallographic factor of the YSZ (Fig. 1(b)). The CMAS damage developed depending on the crystallographic plane of YSZ; it was the lowest onthe {111} plane.This is a noteworthy finding tomitigate the CMAS damagein EB-PVD top coat. The change in physical properties was also found to be pronounced at the CMAS damaged area. Based on these findings the non-destructive detection was also tried for engineering applications.
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Delamination of ceramic top coat accelerated by CMAS in an EB-PVD thermal barrier coating specimen
Application of thermal barrier coatings (TBCs) which provides thermal insulation to the underlying Nickel-based superalloy substrate has been key technologies in advanced gas turbines. More recently, it has been recognized that the TBCs can be damaged by calcium–magnesium–alumino-silicates (CMAS) resulting from siliceous minerals (dust, sand, ash) containing the intake air and from unclean fuels such as a syngas and biomass gas. In this work basic mechanisms and mechanics as well as the kinetics, were explored, via a model CMAS, by specifying a TBC specimen which consisted of a Ni-base superalloy, MCrAlY bond coat and YSZ top coat fabricated by electron beam physical vapor deposition (EB-PVD) process. It was demonstrated that the penetration and the resultant phase transformation of the YSZ with the CMAS were basic mechanisms(Fig.1(a)). It was a particular finding that the thickness of thermal grown oxide was significantly accelerated by CMAS at the top/bond coat interface, resulting in a predominant delamination of top coat(Fig.1(b)). The behavior was discussed, in comparison with that in the TBC specimen fabricated by an air plasma spraying process(Fig.1(c)).
Please click Additional Files below to see the full abstract
Material damage in TBCs by a synthetic CMAS and the non-destructive detection:-An exploration via a single crystal YSZ-
More recently a new type of damage has been pronounced in thermal barrier coatings (TBCs) by calcium-magnesium-alumino-silicates (CMAS) from ingestion of siliceous minerals under certain operating conditions, based on synthetic material in Table 1. In order to understand material aspect of CMAS damage, a study on material interaction between a synthetic CMAS and a single crystal yttria-stabilized zirconia (YSZ) was studied in this work. Here, the effect of crystallographic orientation on the interaction was also investigated. The experimental works clearly showed that the material interaction between the CMAS and YSZ was significant, resulting in the change in microstructural morphology(Fig. 1(a)). The extent of interaction depended on the crystallographic factor of the YSZ (Fig. 1(b)). The CMAS damage developed depending on the crystallographic plane of YSZ; it was the lowest onthe {111} plane.This is a noteworthy finding tomitigate the CMAS damagein EB-PVD top coat. The change in physical properties was also found to be pronounced at the CMAS damaged area. Based on these findings the non-destructive detection was also tried for engineering applications.
Please click Additional Files below to see the full abstract
Feasibility of Controlling Gas Concentration and Temperature Distributions in a Semiconductor Chamber with CT-TDLAS
The feasibility to control the gas concentration and temperature distributions in a semiconductor process chamber by measuring them was investigated. Gas concentration and temperature distributions for various flow rates were measured with the computed tomography-tunable diode laser absorption spectroscopy (CT-TDLAS). The infrared absorption spectra of multiple laser paths passing through the measured area were collected and the distributions of methane concentration and temperature in the chamber were reconstructed with the computed tomography (CT) calculations. The measured results indicated that the distributions can be independently controlled by measuring with the CT-TDLAS and adjusting the flow rates and the susceptor temperature
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