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1 research outputs found
Fault-tolerant sub-lithographic design with rollback recovery
Author
André DeHon
Austin T
+22 more
Avizienis A
Betz V Rose Jonathan
de Kock E A Essink G Smits W J M van der Wolf P Brunel J-Y Kruijtzer W M Lieverse P Vissers K A
DeHon A
DeHon A Wilson M J
Hareland S Maiz J Alavi M Mistry K Walsta S Dai C
Helia Naeimi
International Technology Roadmap for Semiconductors
Kahn G
Lala P K
Lee E A
Lyons R E
Mitra S McCluskey E J
Naeimi H DeHon A
Nicolaidis M
Nicolaidis M
Nikolić K
Shaw M
Swanson J A
Tuba N A
Von Neumann J
Wakerly J
Publication venue
'IOP Publishing'
Publication date
Field of study
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