The Impacts of Knowledge Interaction with Manufacturing Clients on KIBS Firms Innovation Behaviour

knowledge-intensive business services (KIBS), knowledge interaction, innovations systems

Miniaturized Resonator and Bandpass Filter for Silicon-Based Monolithic Microwave and Millimeter-Wave Integrated Circuits

© 2018 IEEE. © 2018 IEEE. Personal use is permitted, but republication/redistribution requires IEEE permission.This paper introduces a unique approach for the implementation of a miniaturized on-chip resonator and its application for the first-order bandpass filter (BPF) design. This approach utilizes a combination of a broadside-coupling technique and a split-ring structure. To fully understand the principle behind it, simplified LC equivalent-circuit models are provided. By analyzing these models, guidelines for implementation of an ultra-compact resonator and a BPF are given. To further demonstrate the feasibility of using this approach in practice, both the implemented resonator and the filter are fabricated in a standard 0.13-μm (Bi)-CMOS technology. The measured results show that the resonator can generate a resonance at 66.75 GHz, while the BPF has a center frequency at 40 GHz and an insertion loss of 1.7 dB. The chip size of both the resonator and the BPF, excluding the pads, is only 0.012mm 2 (0.08 × 0.144 mm 2).Peer reviewe

Local order measurement in SnGe alloys and monolayer Sn films on Si with reflection electron energy loss spectrometry

Measurements of local order are demonstrated in Sn-containing alloys and epitaxial monolayer thickness films by analysis of extended-edge energy loss fine structure (EXELFS) data obtained by reflection electron energy loss spectrometry (REELS). These measurements of short-range order provide a complement to the chemical information obtained with REELS and long-range order obtained using reflection high energy electron diffraction. The results suggest that EXELFS measurements are practical for samples mounted on the growth manipulator in a molecular beam epitaxy chamber. Advantages and limitations of reflection EXELFS are discussed

Using Context and Interactions to Verify User-Intended Network Requests

Client-side malware can attack users by tampering with applications or user interfaces to generate requests that users did not intend. We propose Verified Intention (VInt), which ensures a network request, as received by a service, is user-intended. VInt is based on "seeing what the user sees" (context). VInt screenshots the user interface as the user interacts with a security-sensitive form. There are two main components. First, VInt ensures output integrity and authenticity by validating the context, ensuring the user sees correctly rendered information. Second, VInt extracts user-intended inputs from the on-screen user-provided inputs, with the assumption that a human user checks what they entered. Using the user-intended inputs, VInt deems a request to be user-intended if the request is generated properly from the user-intended inputs while the user is shown the correct information. VInt is implemented using image analysis and Optical Character Recognition (OCR). Our evaluation shows that VInt is accurate and efficient

Countering Social Engineering through Social Media: An Enterprise Security Perspective

The increasing threat of social engineers targeting social media channels to advance their attack effectiveness on company data has seen many organizations introducing initiatives to better understand these vulnerabilities. This paper examines concerns of social engineering through social media within the enterprise and explores countermeasures undertaken to stem ensuing risk. Also included is an analysis of existing social media security policies and guidelines within the public and private sectors.Comment: Proceedings of The 7th International Conference on Computational Collective Intelligence Technologies and Applications (ICCCI 2015), LNAI, Springer, Vol. 9330, pp. 54-6

In situ real-time analysis of alloy film composition and segregation dynamics with parallel detection reflection electron energy loss spectroscopy

Real-time measurements of GexSi1 – x/Si(001) composition and segregation dynamics in Sn/Si(001) in molecular beam epitaxy are demonstrated using parallel detection reflection electron energy loss spectroscopy. Parallel detection enables quantitative acquisition of low-loss spectra in a time of < 500 µs and surface composition determination in GexSi1 – x/Si(001) via Ge L2,3 core loss analysis to a precision of approximately 2% in time of order 1 s. Segregation and trapping kinetics of monolayer thickness Sn films during Si epitaxy on Sn-covered Si(100) has also been studied using the Sn M4.5 core loss