A rigourous description of electrodynamical and photothermal response by the matrix formalism in layered systems

A description of layered samples under modulated laser beam irradiation is given. With the help of the matrix formalism charge carrier wave as well as temperature wave may be calculated

Measurement of surface recombination of excess carriers by use of the double modulation technique

The well characterized (100)-Si surface subjected to low energy ion irradiation is used to demonstrate the capability of the contactless measurement of the surface recombination velocity of excess carriers by applying the photothermal response technique under high vacuum conditions. During and after the processing the photothermal response is recorded in the frequency domain. From the wide range frequency sweep surface recombination velocities between 1 m/s up to 1000 m/s can be extracted

In-situ investigation of ion implantation processes by thermal wave analysis

High-fluence N+-implantation in steel is monitored by use of nondestructive and contactless photothermal measurements during the implantation process. The modulated reflectivity is correlated with the results of Knoop hardness testing. On-line measurements on the steel surface and direct ion beam monitoring from the back side of a monitor sample are demonstrated. The maximum of the ion implantation induced hardness is strongly correlated with the phase transition indicated by the thermomodulated dielectric function