n-Dotierung von Diamant durch Alkalimetalle und Schwefel Schlussbericht

Available from TIB Hannover: DtF QN1(103,50) / FIZ - Fachinformationszzentrum Karlsruhe / TIB - Technische InformationsbibliothekSIGLEBundesministerium fuer Bildung und Forschung, Berlin (Germany)DEGerman

Cell adhesion properties on-photochemically functionalized diamond

10.1021/la070037yLangmuir23105615-5621LANG

Grazing-incidence small-angle X-ray scattering study on ultra nanocrystalline diamond films

In this work, an ultrananocrystalline diamond film was studied with grazing-incidence small-angle X-ray scattering (GISAXS) to determine the diamond grain size and average distance of the grains with a non-destructive method and with excellent sampling statistics. The measured 2D GISAXS patterns were modelled with the assumption of monodisperse spheres. The best fits were obtained with the "buried layer" model where the spheres are correlated within the film plane. This correlation was approximated with a two-dimensional Percus–Yevick structure factor. The average diamond grain size of D = 8.0–8.5 nm and a centre-to-centre distance of the grains with 10.4–11.9 nm agrees well with transmission electron microscopy results of comparable samples

Photoconductive properties of single-crystal CVD diamond

A single-crystal homoepitaxial CVD diamond film, grown on a Ib-type diamond substrate, was analysed using optical and electro-optical measurements. The type and the distribution of its crystalline defects are discussed in connection with its photoconductive response to deep UV light. A similar device based on a high quality polycrystalline CVD diamond was also analysed using the same techniques in order to compare the results. Raman spectroscopy and photoluminescence (PL) have been used to assess the crystalline quality and to study the distribution of defects in the films, respectively. The results of the electro-optical measurements show that the single crystal diamond has very high responsivity and signal-to-noise ratio. Hence, the role of defects on the detection performance is discussed. © 2003 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim