1 research outputs found
Time-of-Flight Scattering and Recoiling Spectrometry (TOF-SARS) for Surface Analysis
- Author
- AGJ Dit
- AJ Algra
- AJ Algra
- AJ Algra
- B Poelsema
- BJJ Koeleman
- C Oshima
- DE Eastman
- DJ Godfrey
- DJ Godfrey
- DJ O’Connor
- DP Smith
- DR Muffins
- ES Mashkova
- FW Meyer
- G Zampieri
- G Zampieri
- H Derko
- H Nakamatsu
- H Niehus
- H Niehus
- H Niehus
- H Niehus
- H Niehus
- H Niehus
- H Niehus
- H Niehus
- HH Brongersma
- HU Brongersma
- J Mischler
- J Möller
- J Möller
- J Onsgaard
- JA Berg Van Den
- JA Matthew
- JA Schultz
- JA Schultz
- JA Schultz
- JA Yarmoff
- JA Yarmoff
- JF Ziegler
- JH Huang
- JH Huang
- JM Zoest van
- JN Chen
- JW Rabalais
- JW Rabalais
- JW Rabalais
- JW Rabalais
- JW Rabalais
- JW Rabalais
- JW Rabalais
- K Matsuda
- L Marchut
- LK Verheij
- M Aono
- M Aono
- M Aono
- M Barat
- M Saitoh
- MH Mintz
- MH Mintz
- MH Mintz
- MH Mintz
- N Stolterfoht
- R Baragiola
- R Souda
- R Whaley
- RPN Bronkers
- RS Williams
- S Prigge
- SH Overbury
- SR Kasi
- SV Pepper
- T Fauster
- T Fauster
- T Fauster
- TL Porter
- TL Porter
- TL Porter
- TM Buck
- TM Hupkens
- TM Hupkens
- TN Taylor
- U Umke
- W Englert
- W Heiland
- W Hetterich
- W Hetterich
- WP Ellis
- YS Jo
- Publication venue
- 'Springer Science and Business Media LLC'
- Publication date
- 01/01/1990
- Field of study