Polarization dependency of the 3D transfer behavior in microsphere enhanced interferometry

Enhancing the lateral resolution limit in optical microscopy and interferometry is of great interest in recent research. In order to laterally resolve structures including feature dimensions below the resolution limit, microspheres applied in the optical near-field of the specimen are shown to locally improve the resolution of the imaging system. Experimental and simulated results following this approach obtained by a high NA Linnik interferometer are analyzed in this contribution. For further understanding of the transfer characteristics, measured interference data are compared with FEM (finite element method) based simulations with respect to the polarization dependency of the relevant image information

Experimental and numerical polarization analysis of the 3D transfer behavior in microsphere-assisted interferometry for 1D phase gratings

Enhancing the lateral resolution in optical microscopy and interferometry is of great interest in recent research. In order to laterally resolve structures including feature dimensions below the Abbe resolution limit, microspheres in the optical near-field of the specimen are shown to locally improve the resolution of the imaging system. Experimental and simulated results following this approach are obtained by a high NA Linnik interferometer and analyzed in this contribution. They show the reconstructed surface of a 1D phase grating below the resolution limit. For further understanding of the transfer characteristics, measured interference data are compared with FEM (finite element method) based simulations with respect to the polarization dependency of the relevant image information for 1D phase gratings. Therefore, the implemented Koehler illumination as well as the experimental setup utilize polarized light

Experimental and numerical polarization analysis of the 3D transfer behavior in microsphere-assisted interferometry for 1D phase gratings

Gefördert durch den Publikationsfonds der Universität Kasse

Lateral resolution enhanced interference microscopy using virtual annular apertures

Gefördert im Rahmen des Projekts DEA

Lateral resolution enhanced interference microscopy using virtual annular apertures

The lateral resolution in microscopic imaging generally depends on both, the wavelength of light and the numerical aperture of the microscope objective lens. To quantify the lateral resolution Ernst Abbe considered an optical grating illuminated by plane waves. In contrast, the Rayleigh criterion holds for two point sources or point scatterers separated by a lateral distance, which are supposed to emit spherical waves. A portion of each spherical wave is collected by the objective lens and results in an Airy disc corresponding to a diffraction limited intensity point spread function (PSF). If incoherent illumination is employed the intensity PSFs related to different scatterers on an object are added resulting in the well-known Rayleigh resolution criterion. In interference microscopy instead of the intensity the electric field scattered or diffracted by an object will be affected by the transfer function of the optical imaging system. For a reflective object the lateral resolution of an interference microscope can be again characterized by the Abbe limit if the object under investigation is a grating. However, if two irregularities on a flat surface are being imaged the resolution no longer obeys the Rayleigh criterion. Instead, it corresponds to an optical system with an annular aperture and thus surpasses the prediction given by the Rayleigh criterion. This holds true for both, amplitude as well as phase objects, as it will be elucidated in this study by theoretical considerations, simulation results and an experimental proof of principle

Spectral composition of low-coherence interferograms at high numerical apertures

Gefördert durch den Publikationsfonds der Universität Kasse

Microsphere-assisted quantitative phase microscopy: a review

Light microscopes are the most widely used devices in life and material sciences that allow the study of the interaction of light with matter at a resolution better than that of the naked eye. Conventional microscopes translate the spatial differences in the intensity of the reflected or transmitted light from an object to pixel brightness differences in the digital image. However, a phase microscope converts the spatial differences in the phase of the light from or through an object to differences in pixel brightness. Interference microscopy, a phase-based approach, has found application in various disciplines. While interferometry has brought nanometric axial resolution, the lateral resolution in quantitative phase microscopy (QPM) has still remained limited by diffraction, similar to other traditional microscopy systems. Enhancing the resolution has been the subject of intense investigation since the invention of the microscope in the 17th century. During the past decade, microsphere-assisted microscopy (MAM) has emerged as a simple and effective approach to enhance the resolution in light microscopy. MAM can be integrated with QPM for 3D label-free imaging with enhanced resolution. Here, we review the integration of microspheres with coherence scanning interference and digital holographic microscopies, discussing the associated open questions, challenges, and opportunities