6 research outputs found
Optimal static and dynamic recycling of defective binary devices
The binary Defect Combination Problem consists in finding a fully working
subset from a given ensemble of imperfect binary components. We determine the
typical properties of the model using methods of statistical mechanics, in
particular, the region in the parameter space where there is almost surely at
least one fully-working subset. Dynamic recycling of a flux of imperfect binary
components leads to zero wastage.Comment: 14 pages, 15 figure