Simultaneous ground-state cooling of multiple degenerate mechanical modes through cross-Kerr effect

Simultaneous ground-state cooling of multiple degenerate mechanical modes is a tough issue in optomechanical system due to the existence of the dark mode effect. Here we propose a universal and scalable method to break the dark mode effect of two degenerate mechanical modes by introducing the cross-Kerr (CK) nonlinearity. At most four stable steady states can be achieved in our scheme in the presence of the CK effect, different from the bistable behavior of the standard optomechanical system. Under the constant input laser power, the effective detuning and mechanical resonant frequency can be modulated by the CK nonlinearity, which results in an optimal CK coupling strength for cooling. Similarly, there will be an optimal input laser power for cooling when the CK coupling strength stays fixed. Our scheme can be extended to break the dark mode effect of multiple degenerate mechanical modes by introducing more than one CK effects. To fulfill the requirement of the simultaneous ground-state cooling of N multiple degenerate mechanical modes N-1 CK effects with different strengths are needed. Our proposal provides new insights in dark mode control and might pave the way to manipulating of multiple quantum states in macroscopic system.Comment: 5 pages, 4 figure

A LTE MIMO OTA Test System Using Vector Signal Transceivers

A 2 × 2 multiple-input-multiple-output over-the-air (MIMO OTA) test system based on four field-programmable Vector-Signal-Transceiver (VST) modules is presented. The system enables 2 x 2 MIMO OTA testing by assembling of a twochannel Evolved Node B (eNodeB) LTE base station emulator, a 2x2 channel emulator, and a two-channel user equipment (UE) simulator. A two-stage MIMO OTA test method has been demonstrated with downlink Long-Term Evolution Time-Division Duplex (LTE-TDD) mode using different modulation and coding schemes (MCSs). Test results and analysis are shown. This system will allow a systematic study of MIMO OTA metrology needs