419 research outputs found

    Enseigner L’Etranger de Baudelaire ou initier l’étudiant à la quête de l’identité

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    Si nous souhaitons lire une poĂ©sie distinguĂ©e par une langue Ă  la fois incomparable et rigoureuse, nous ne retrouvons pas mieux que celle de Charles Baudelaire. Ce poète cĂ©lèbre du XIXe siècle nous a tant inspirĂ©. En effet, la lecture de son recueil Les Fleurs du mal qui favorise le contact de l’âme et l’esprit Ă  travers l’expression d’un monde spirituel original crĂ©e par un homme tiraillĂ© entre une Ă©criture idĂ©ale mais mystique, valorise notre apprĂ©ciation de ce poète. Cette lecture nous a permis d’étudier, avec un certain enthousiasme, diffĂ©rents poèmes tels que « L’albatros Â» et « Correspondances Â», en tant qu’étudiante de langue et de littĂ©rature françaises. Par la suite, la richesse du langage baudelairien nous a incitĂ©e, en tant qu’enseignante, Ă  choisir son texte comme un support d’un cours d’histoire littĂ©raire adressĂ© aux Ă©tudiants de deuxième annĂ©e Licence d’Education et d’Enseignement. Dans l’intention de dĂ©finir le XIXe siècle ainsi que ses diffĂ©rents mouvements littĂ©raires, nous avons optĂ© pour l’étude du poème « L’étranger Â»[i] de Baudelaire afin de traiter la question du vers libre qui annonce en mĂŞme temps l’étude de la poĂ©sie moderne du XXe siècle. Alors, par quoi se distingue l’enseignement de la poĂ©sie de Baudelaire ?   [i] Tous les vers citĂ©s sont extraits du recueil Le Spleen de Paris. Charles Baudelaire, L’étranger, Le Spleen de Paris (Paris: Classiques français, 1997), p. 11

    Outstanding properties of epitaxial graphene grown from silicon carbide substrate

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    In this thesis a study of outstanding properties of epitaxial graphene on SiC were carried out involving Raman spectroscopy, AFM, UFM, XPS, Photoelectric effect and electrical resistivity. Epitaxial graphene was grown from a semi-insulating on-axis 6H (000-1) or 4H-SiC (000-1) substrate. Epitaxial growth is based on Si atoms sublimation from the SiC substrate bulk. We used the basics of epitaxial graphene growth; however small details were changed. This allowed the growth of various layers, new features and new properties. X-ray photoelectron spectroscopy XPS was used to identify the different components forming within the graphene substrate system. The graphene layer number is evidenced by XPS. Atoms percentages in the grown graphene layer were determined. Furthermore, the oxidation of the graphene layers was clearly distinguished. Atomic force microscopy AFM was carried out to study the topography response of the graphene sample. This distinguishes any morphological changes of the graphene layer. The size, orientation and regularity of the layers terraces were determined. For the first time, new features such as: island, bubbles and domes of graphene layers were identified. The nature of these features was determined using ultra force microscopy UFM . High-resolution micro-Raman (Jobin Yvon HR LabRAM) was employed to illustrate all the revealed properties. Nonetheless, it illustrates the doping, defects, disorder, number of layers and phonon-plasmon coupling of epitaxial graphene. These properties were carefully demonstrated based on local Raman mapping. The findings of these investigations indicate the formation of various types of epitaxial graphene layers. These latest could have various forms with new electrical properties. This was illustrated using a comparative study to mechanical properties of epitaxial graphene island. In fact, new charge distribution was found across these features. These findings also differs from other electrical properties found in flat graphene layers. These latest shows electroneutrality of charge distribution between graphene SiC substrate. Here, Phonons- plasmons coupling in epitaxial graphene SiC substrate system were illustrated. On other hand, epitaxial graphene properties were not limited to the graphene layers flatness. In fact, new photoresponse of epitaxial graphene under violet light was revealed. Here, photo resistance increase during to epitaxial graphene morphology

    Terahertz detectors with semimetallic and semiconducting quantum wells

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    Diese Arbeit beschäftigt sich mit der Entwicklung und Erforschung geeigneter THz-Detektoren, die sowohl eine hohe Empfindlichkeit, hohe Detektivität und spektrale Durchstimmbarkeit besitzen. Die Detektion beruht hier auf optisch oder thermisch angeregten Übergängen zwischen Landauniveaus, wobei die Energielücke zwischen zwei Landau-Niveaus mit einem Magnetfeld durchgestimmt werden kann. Da die Energielücken zwischen Landau-Niveaus in typischen Quanten-Hall-Systemen (QHS) bei etwa 7-12 meV liegen, was Zyklotronresonanzfrequenzen von 1.7-2.9 THz entspricht, kommen die QHS als THz-Detektoren in Frage. Zur optischen Anregung steht uns ein p-Germanium-Laser zur Verfügung, der zwischen 1.7 und 2.5 THz (lambda=120-180 mikrometer) durchstimmbar ist. Der Laser arbeitet im Impulsbetrieb (Impulslänge einstellbar zwischen 0.3 und 50 mikrosekunde, Wiederholrate 1 Hz) und wird mit einer Starkstrom-Impulsquelle (durch ein Modul mit Feldeffekt-Transistoren, FET) elektrisch gepumpt. Die Messungen wurden an HgTe/HgCdTe und InSb/AlInSb-Strukturen bei tiefen Temperaturen (T=4K) und bei hohen Magnetfeldern 0T<B<7T durchgeführt. Alle Proben wurden charakterisiert, bevor sie der THz-Strahlung ausgesetzt wurden. Die Messungen zur Untersuchung der Fotoleitfähigkeit wurden an QH-Proben in Corbino-Geometrie durchgeführt, da hier eine impedanzangepasste Messung des Fotosignals mit einer Hochfrequenz-Apparatur möglich ist. Das Fotosignal wird durch Überlagerung des Zyklotronresonanz-(ZR)- und des Bolometer-Effektes erklärt. Weiterhin haben wir die Transmission von THz-Wellen durch unsere Proben bei verschiedenen Photonenenergien in Arbeitsbereich unseres Lasers gemessen, dadurch werden die Zyklotronmasse bestimmt. Die spektrale Auflösung als anwendungsrelevante Größe konnte aus magnetfeldabhängigen Messungen bestimmt werden. Durch ausführliche zeitaufgelöste Messungen wurde die Relaxationszeit in Abhängigkeit vom Lastwiderstand bestimmt. Folglich können wir aus den Messergebnissen schließen, dass die beiden Materialsysteme (HgTe/HgCdTe, InSb/AlInSb) als THz-Detektoren bei Magnetfeldern unter 2 T geeignet sind.This work deals with the development and investigation of suitable THz detectors, which have a high sensitivity, high detectivity and spectral tunability. The detection here is based on optically or thermally excited transitions between Landau levels, where the energy gap between two Landau levels can be tuned with a magnetic field. Since the energy gaps between Landau levels in a typical quantum Hall systems (QHS) are about 7-12 meV (corresponding to cyclotron resonance frequency of 1.7-2.9 THz) the QHS are suitable as THz detectors. For our studies, we use a p-Ge laser which is continuously tunable in the wavelength range of lambda=120- 180 micrometer (1.7-2.5THz).The laser operates in pulsed mode (pulse length is adjustable between 0.3 and 50 microseconds, repetition rate 1 Hz) and with a high-voltage pulse source (through a module with field effect transistors, FET) electrically pumped. The measurements were performed on HgTe / HgCdTe and InSb / AlInSb structures at low temperatures (T = 4K) and in high magnetic fields of 0T <B <7T. All samples were characterized before they were exposed to the THz radiation. The measurements for the investigation of the photoconductivity were performed on samples in the QH-Corbino geometry since an impedance-matched measurement of the photosignal with a high-frequency measuring setup is possible. The photosignal is explained by the superposition of the cyclotron resonance (CR) - and the bolometer effect. Furthermore, we have measured the transmission of THz waves by our samples at different photon energies in the operational area of our laser. This way we determined the cyclotron mass. The spectral resolution as an application-relevant parameter could be determined from magnetic field-dependent measurements. By detailed time-resolved measurements, the relaxation time was determined by varying the load resistance. Consequently, we can deduce from the measurement results that the two material systems (HgTe / HgCdTe, InSb / AlInSb) are suitable as THz detectors for magnetic fields below 2 T
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