Multi-faceted microarchitecture level reliability characterization for NVIDIA and AMD GPUs

State-of-the-art GPU chips are designed to deliver extreme throughput for graphics as well as for data-parallel general purpose computing workloads (GPGPU computing). Unlike computing for graphics, GPGPU computing requires highly reliable operations. Since provisioning for high reliability may affect performance, the design of GPGPU systems requires the vulnerability of GPU workloads to soft-errors to be jointly evaluated with the performance of GPU chips. We present an extended study based on a consolidated workflow for the evaluation of the reliability in correlation with the performance of four GPU architectures and corresponding chips: AMD Southern Islands and NVIDIA G80/GT200/Fermi. We obtained reliability measurements (AVF and FIT) employing both fault injection and ACE-analysis based on microarchitecture-level simulators. Apart from the reliability-only and performance-only measurements, we propose combined metrics for performance and reliability that assist comparisons for the same application among GPU chips of different ISAs and vendors, as well as among benchmarks on the same GPU chip

Microarchitecture level reliability comparison of modern GPU designs: First findings

State-of-the-art GPU chips are designed to deliver extreme throughput for graphics as well as for data-parallel general purpose computing workloads (GPGPU computing). Unlike graphics computing, GPGPU computing requires highly reliable operation. The performance-oriented design of GPUs requires to jointly evaluate the vulnerability of GPU workloads to soft-errors with the performance of GPU chips. We briefly present a summary of the findings of an extensive study aiming at the evaluation of the reliability of four GPU architectures and corresponding chips, orrelating them with the performance of the workloads

Cross-layer soft-error resilience analysis of computing systems

In a world with computation at the epicenter of every activity, computing systems must be highly resilient to errors even if miniaturization makes the underlying hardware unreliable. Techniques able to guarantee high reliability are associated to high costs. Early resilience analysis has the potential to support informed design decisions to maximize system-level reliability while minimizing the associated costs. This tutorial focuses on early cross-layer (hardware and software) resilience analysis considering the full computing continuum (from IoT/CPS to HPC applications) with emphasis on soft errors

Evolution of Test Programs Exploiting a FSM Processor Model

Microprocessor testing is becoming a challenging task, due to the increasing complexity of modern architectures. Nowadays, most architectures are tackled with a combination of scan chains and Software-Based Self-Test (SBST) methodologies. Among SBST techniques, evolutionary feedback-based ones prove effective in microprocessor testing: their main disadvantage, however, is the considerable time required to generate suitable test programs. A novel evolutionary-based approach, able to appreciably reduce the generation time, is presented. The proposed method exploits a high-level representation of the architecture under test and a dynamically built Finite State Machine (FSM) model to assess fault coverage without resorting to time-expensive simulations on low-level models. Experimental results, performed on an OpenRISC processor, show that the resulting test obtains a nearly complete fault coverage against the targeted fault mode

Cross-Layer Early Reliability Evaluation for the Computing cOntinuum

Advanced multifunctional computing systems realized in forthcoming technologies hold the promise of a significant increase of the computational capability that will offer end-users ever improving services and functionalities (e.g., next generation mobile devices, cloud services, etc.). However, the same path that is leading technologies toward these remarkable achievements is also making electronic devices increasingly unreliable, posing a threat to our society that is depending on the ICT in every aspect of human activities. Reliability of electronic systems is therefore a key challenge for the whole ICT technology and must be guaranteed without penalizing or slowing down the characteristics of the final products. CLERECO EU FP7 (GA No. 611404) research project addresses early accurate reliability evaluation and efficient exploitation of reliability at different design phases, since these aspects are two of the most important and challenging tasks toward this goal

Exceeding Conservative Limits: A Consolidated Analysis on Modern Hardware Margins

Modern large-scale computing systems (data centers, supercomputers, cloud and edge setups and high-end cyber-physical systems) employ heterogeneous architectures that consist of multicore CPUs, general-purpose many-core GPUs, and programmable FPGAs. The effective utilization of these architectures poses several challenges, among which a primary one is power consumption. Voltage reduction is one of the most efficient methods to reduce power consumption of a chip. With the galloping adoption of hardware accelerators (i.e., GPUs and FPGAs) in large datacenters and other large-scale computing infrastructures, a comprehensive evaluation of the safe voltage reduction levels for each different chip can be employed for efficient reduction of the total power. We present a survey of recent studies in voltage margins reduction at the system level for modern CPUs, GPUs and FPGAs. The pessimistic voltage guardbands inserted by the silicon vendors can be exploited in all devices for significant power savings. On average, voltage reduction can reach 12% in multicore CPUs, 20% in manycore GPUs and 39% in FPGAs.Comment: Accepted for publication in IEEE Transactions on Device and Materials Reliabilit

Cross-layer reliability evaluation, moving from the hardware architecture to the system level: A CLERECO EU project overview

Advanced computing systems realized in forthcoming technologies hold the promise of a significant increase of computational capabilities. However, the same path that is leading technologies toward these remarkable achievements is also making electronic devices increasingly unreliable. Developing new methods to evaluate the reliability of these systems in an early design stage has the potential to save costs, produce optimized designs and have a positive impact on the product time-to-market. CLERECO European FP7 research project addresses early reliability evaluation with a cross-layer approach across different computing disciplines, across computing system layers and across computing market segments. The fundamental objective of the project is to investigate in depth a methodology to assess system reliability early in the design cycle of the future systems of the emerging computing continuum. This paper presents a general overview of the CLERECO project focusing on the main tools and models that are being developed that could be of interest for the research community and engineering practice

MeRLiN: Exploiting dynamic instruction behavior for fast and accurate microarchitecture level reliability assessment

Early reliability assessment of hardware structures using microarchitecture level simulators can effectively guide major error protection decisions in microprocessor design. Statistical fault injection on microarchitectural structures modeled in performance simulators is an accurate method to measure their Architectural Vulnerability Factor (AVF) but requires excessively long campaigns to obtain high statistical significance. We propose MeRLiN1, a methodology to boost microarchitecture level injection-based reliability assessment by several orders of magnitude and keep the accuracy of the assessment unaffected even for large injection campaigns with very high statistical significance. The core of MeRLiN is the grouping of faults of an initial list in equivalent classes. All faults in the same group target equivalent vulnerable intervals of program execution ending up to the same static instruction that reads the faulty entries. Faults in the same group occur in different times and entries of a structure and it is extremely likely that they all have the same effect in program execution; thus, fault injection is performed only on a few representatives from each group. We evaluate MeRLiN for different sizes of the physical register file, the store queue and the first level data cache of a contemporary microarchitecture running MiBench and SPEC CPU2006 benchmarks. For all our experiments, MeRLiN is from 2 to 3 orders of magnitude faster than an extremely high statistical significant injection campaign, reporting the same reliability measurements with negligible loss of accuracy. Finally, we theoretically analyze MeRLiN's statistical behavior to further justify its accuracy.Peer ReviewedPostprint (author's final draft