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    3 research outputs found

    Universal model of bias-stress-induced instability in inkjet-printed carbon nanotube networks field-effect transistors

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    'Elsevier BV'
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    The electron trap parameter extraction-based investigation of the relationship between charge trapping and activation energy in IGZO TFTs under positive bias temperature stress

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    'Elsevier BV'
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    Effect of oxygen content of the LaAlO 3 layer on the synaptic behavior of Pt/LaAlO 3 /Nb-doped SrTiO 3 memristors for neuromorphic applications

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    'Elsevier BV'
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