Study of the effect of stress-induced trap level on OLED characteristics by numerical model

none4We propose a numerical model for double layer and double carrier injection OLED. We studied the stress-induced trap generation by using the numerical model, providing information about the trap density and trap location. To validate our model, we compared our simulation results to data reported in the literature, showing good agreement in electrical characteristics.noneA. Cester; D. Bari; N. Wrachien; G. MeneghessoCester, Andrea; Bari, Daniele; Wrachien, Nicola; Meneghesso, Gaudenzi