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39 research outputs found

Extensions to backward propagation of variance for statistical modeling

Author: Gildenblat G.
Li X.
McAndrew C. C.
Stevanovic I.
Publication venue: 'Institute of Electrical and Electronics Engineers (IEEE)'
Publication date: 29/03/2010
Field of study

Infoscience - École polytechnique fédérale de Lausanne

Symmetric bulk charge linearisation in charge-sheet MOSFET model

Author: Brews
Chen
G. Gildenblat
Gildenblat
Joardar
T.L. Chen
Ward
Publication venue: 'Institution of Engineering and Technology (IET)'
Publication date: 01/01/2001
Field of study

Crossref

Analytical approximation for perturbation of MOSFET surface potential by polysilicon depletion layer

Author: Arora
G. Gildenblat
Gildenblat
Gildenblat
Joardar
Liu
P. Bendix
Rios
T.L. Chen
Publication venue: 'Institution of Engineering and Technology (IET)'
Publication date: 01/01/1999
Field of study

Crossref

Closed-form approximation for the perturbation of MOSFET surface potential by quantum-mechanical effects

Author: G. Gildenblat
Gildenblat
Gildenblat
Hareland
Hareland
P. Bendix
Rios
T.L. Chen
Van Dort
Publication venue: 'Institution of Engineering and Technology (IET)'
Publication date: 01/01/2000
Field of study

Crossref

Technical Note PR-TN 2006/00302 Issued: 04/2006

Author: G. Gildenblat
Publication venue
Publication date
Field of study

From BSIM3/4 to PSP Translation of flicker noise and junction parameters The PSP model is a joint development of The Pennsylvania State University and Philips Research A.J. Scholten; G.D.J. Smit; R. van Langevelde; D.B.M. Klaassen

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