Counting matroids in minor-closed classes

A flat cover is a collection of flats identifying the non-bases of a matroid. We introduce the notion of cover complexity, the minimal size of such a flat cover, as a measure for the complexity of a matroid, and present bounds on the number of matroids on $n$ elements whose cover complexity is bounded. We apply cover complexity to show that the class of matroids without an $N$-minor is asymptotically small in case $N$ is one of the sparse paving matroids $U_{2,k}$, $U_{3,6}$, $P_6$, $Q_6$, or $R_6$, thus confirming a few special cases of a conjecture due to Mayhew, Newman, Welsh, and Whittle. On the other hand, we show a lower bound on the number of matroids without $M(K_4)$-minor which asymptoticaly matches the best known lower bound on the number of all matroids, due to Knuth.Comment: 13 pages, 3 figure

On the number of matroids

We consider the problem of determining $m_n$, the number of matroids on $n$ elements. The best known lower bound on $m_n$ is due to Knuth (1974) who showed that $\log \log m_n$ is at least $n-3/2\log n-1$. On the other hand, Piff (1973) showed that $\log\log m_n\leq n-\log n+\log\log n +O(1)$, and it has been conjectured since that the right answer is perhaps closer to Knuth's bound. We show that this is indeed the case, and prove an upper bound on $\log\log m_n$ that is within an additive $1+o(1)$ term of Knuth's lower bound. Our proof is based on using some structural properties of non-bases in a matroid together with some properties of independent sets in the Johnson graph to give a compressed representation of matroids.Comment: Final version, 17 page

An entropy argument for counting matroids

We show how a direct application of Shearers' Lemma gives an almost optimum bound on the number of matroids on $n$ elements.Comment: Short note, 4 page

R.F. planar magnetron sputtered ZnO films II: Electrical properties

The electrical properties of r.f. planar magnetron sputtered ZnO films are studied by means of current-voltage, capacitance-voltage and Van der Pauw measurements.\ud \ud These films are applied as piezoelectric transducers in micromechanical sensors and actuators. Their piezoelectric behaviour strongly depends on the electric properties.\ud \ud A conduction model for the polycrystalline ZnO layers is presented. This model gives a good description of the electrical behaviour, and is useful in understanding the piezoelectric properties of the films studied