Stability of some epoxy-encapsulated diode thermometers

The stability upon thermal cycling and handling of ten small, epoxy-encapsulated silicon diode thermometers at six temperatures in the range from liquid nitrogen temperatures to about 60 C. The nominal temperatures of measurement were -196, -78, 0, 20, 40, and 60 C, as measured on the International Practical Temperature Scale of 1968. Diodes were to be thermally cycled 15 to 20 times. Since NASA anticipates that the uncertainty in their temperature measurements will be + or - 50 mK, uncertainties as large as + or - 10 mK in the measurements of the evaluaton can be accommodated without deleteriously affecting the value of the results of the investigation