Band Bending in GaN

Steady-state and transient surface photovoltages in undoped GaN are studied in various environments (air, nitrogen, oxygen, vacuum) at room temperature and 400 K with a Kelvin probe attached to an optical cryostat. The results are explained within a phenomenological model accounting for the accumulation of photo-generated holes at the surface, capture of free electrons from the bulk over the near-surface potential barrier, and emission of electrons from surface states into the bulk. Mechanisms of surface photovoltage are discussed in detail. Photoadsorption and photodesorption of negatively charged species will either increase or decrease the surface potential and thus band bending. Oxygen is the assumed species responsible for the SPV changes in air ambient during continuous UV illumination. This variation in SPV will be confirmed with photoluminescence measurements

Photoadsorption and photodesorption for GaN

The effect of an ambient environment on the surface photovoltage and photoluminescence observed for GaN is studied. In air ambient the upward band bending gradually increases under UVillumination and is explained by the photoinduced chemisorption of surface adsorbates. Specifically, the increase in negative surface charge is consistent with the transfer of electrons from surface states or bulk to oxygen species physisorbed at the GaNsurface. In contrast, the upward band bending gradually decreases in vacuum under UVillumination and can be explained by the photoinduced desorption of these species. The photoadsorption and photodesorption of negatively charged species cause the surface depletion region to increase and decrease, respectively. This change in depletion region width is consistent with the observed decrease in photoluminescence intensity in air ambient and its significant increase in vacuum for a sample with low free electron concentration

INVESTIGATION OF BAND BENDING IN n- AND p-TYPE GaN

This dissertation details the study of band bending in n- and p-type GaN samples with a Kelvin probe utilizing different illumination geometries, ambients (air, oxygen, vacuum 10-6 mbar), and sample temperatures (77 – 650 K). The Kelvin probe, which is mounted inside an optical cryostat, is used to measure the surface potential. Illumination of the GaN surface with band-to-band light generates electron-hole pairs, which quickly separate in the depletion region due to a strong electric field caused by the near-surface band bending. The charge that is swept to the surface reduces the band bending and generates a surface photovoltage (SPV). Information about the band bending can be obtained by fitting the SPV measurements with a thermionic model based on the emission of charge carriers from bulk to surface and vice versa. The band bending in freestanding n-type GaN templates has been evaluated. The Ga-polar and N-polar surfaces exhibit upward band bending of about 0.74 and 0.57 eV, respectively. The surface treatment also plays a major role in the SPV behavior, where the SPV for mechanical polished surfaces restores faster than predicted by a thermionic model in dark. When measuring the photoluminescence (PL) signal, the PL from mechanically polished surfaces was about 4 orders of magnitude smaller than the PL from chemically mechanically polished surfaces. The PL and SPV behaviors were explained by the presence of a large density of defects near the surface, which quench PL and aid in the restoration of the SPV via electron hopping between defects. Temperature-dependent SPV studies have also been performed on doped n- and p-type GaN samples. In Si-doped n-type GaN, the estimated upward band bending was about 1 eV at temperatures between 295 and 500 K. However, in p-type GaN, the downward band bending appeared to increase with increasing temperature, where the magnitude of band bending increased from 0.8 eV to 2.1 eV as the temperature increased from 295 to 650 K. It appears that heating the p-type GaN samples allows for band bending values larger than 1 eV to fully restore. Pre-heating of samples was of paramount importance to measure the correct value of band bending in p-type GaN. The slope of the dependence of the SPV on excitation intensity at low temperatures was larger than expected; however, once the temperature exceeded 500 K, the slope began to reach values that are in agreement with a thermionic model

Surface photovoltage in undoped n-type GaN

Steady-state and transient surface photovoltage (SPV) in undoped GaN is studied in vacuum and air ambient at room temperature and 400 K with a Kelvin probe. The results are explained within a phenomenological model accounting for the accumulation of photogenerated holes at the surface, capture of free electrons from the bulk over the near-surface potential barrier, and emission of electrons from surface states into the bulk. Simple analytical expressions are obtained and compared with experimental results. In particular, the proposed model explains the logarithmic decay of the SPV after stopping illumination. Internal and external mechanisms of the SPV are discussed in detail. It is shown that an internal mechanism dominates at low illumination intensity and/or small photon energies, while external mechanisms such as charging of a surface oxide layer and photoinduced processes play a significant role for above-bandgap illumination with sufficient intensity

Temperature-dependent Kelvin probe measurements of band bending in p-type GaN

The band bending in a Mg-doped, p-type GaN film grown by hydride vapor phase epitaxy was studied at various temperatures. At 295 K, the band bending in dark was calculated to be approximately −1.5 eV. However, when the sample was heated to 600 K for 1 h in dark before performing a measurement at 295 K, the calculated value of band bending in dark became about −2.0 eV. These results are explained by the fact that increasing the sample temperature exponentially increases the rate at which the band bending restores and allows for a more accurate value of band bending to be measured

Determination of the absolute internal quantum efficiency of photoluminescence in GaN co-doped with Si and Zn

The optical properties of high-quality GaN co-doped with silicon and zinc are investigated by using temperature-dependent continuous-wave and time-resolved photoluminescence measurements. The blue luminescence band is related to the ZnGa acceptor in GaN:Si,Zn, which exhibits an exceptionally high absolute internal quantum efficiency (IQE). An IQE above 90% was calculated for several samples having different concentrations of Zn. Accurate and reliable values of the IQE were obtained by using several approaches based on rate equations. The concentrations of the ZnGa acceptors and free electrons were also estimated from the photoluminescence measurements