9 research outputs found
Structural phase transitions in epitaxial perovskite films
Three different film systems have been systematically investigated to
understand the effects of strain and substrate constraint on the phase
transitions of perovskite films. In SrTiO films, the phase transition
temperature T was determined by monitoring the superlattice peaks
associated with rotations of TiO octahedra. It is found that T depends
on both SrTiO film thickness and SrRuO buffer layer thickness. However,
lattice parameter measurements showed no sign of the phase transitions,
indicating that the tetragonality of the SrTiO unit cells was no longer a
good order parameter. This signals a change in the nature of this phase
transition, the internal degree of freedom is decoupled from the external
degree of freedom. The phase transitions occur even without lattice relaxation
through domain formation. In NdNiO thin films, it is found that the
in-plane lattice parameters were clamped by the substrate, while out-of-plane
lattice constant varied to accommodate the volume change across the phase
transition. This shows that substrate constraint is an important parameter for
epitaxial film systems, and is responsible for the suppression of external
structural change in SrTiO and NdNiO films. However, in SrRuO films
we observed domain formation at elevated temperature through x-ray reciprocal
space mapping. This indicated that internal strain energy within films also
played an important role, and may dominate in some film systems. The final
strain states within epitaxial films were the result of competition between
multiple mechanisms and may not be described by a single parameter.Comment: REVTeX4, 14 figure