CORE
🇺🇦Â
 make metadata, not war
Services
Services overview
Explore all CORE services
Access to raw data
API
Dataset
FastSync
Content discovery
Recommender
Discovery
OAI identifiers
OAI Resolver
Managing content
Dashboard
Bespoke contracts
Consultancy services
Support us
Support us
Membership
Sponsorship
Community governance
Advisory Board
Board of supporters
Research network
About
About us
Our mission
Team
Blog
FAQs
Contact us
Filters
1 research outputs found
Investigation of the TiN Gate Electrode With Tunable Work Function and Its Application for FinFET Fabrication
Author
Eiichi Suzuki
Etsuro Sugimata
+10Â more
Hiromi Yamauchi
Kazuhiko Endo
Kenichi Ishii
Kunihiro Sakamoto
Meishoku Masahara
Shinya Kijima
Takashi Matsukawa
Toshihiro Sekigawa
Yongxun Liu
Yoshifumi Takanashi
Publication venue
'Institute of Electrical and Electronics Engineers (IEEE)'
Publication date
Field of study
No full text
Crossref