4 research outputs found

    A New Approach to Measuring Tree-Ring Density Parameters

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    ДрСвСсныС ΠΊΠΎΠ»ΡŒΡ†Π° ΡΠ²Π»ΡΡŽΡ‚ΡΡ ΠΎΠ΄Π½ΠΈΠΌΠΈ ΠΈΠ· Π½Π°ΠΈΠ±ΠΎΠ»Π΅Π΅ достовСрных источников ΠΈΠ½Ρ„ΠΎΡ€ΠΌΠ°Ρ†ΠΈΠΈ ΠΎΠ± условиях ΠΎΠΊΡ€ΡƒΠΆΠ°ΡŽΡ‰Π΅ΠΉ срСды ΠΈ ΠΊΠ»ΠΈΠΌΠ°Ρ‚Π° Π² ΠΏΡ€ΠΎΡˆΠ»ΠΎΠΌ. РСнтгСновская дСнситомСтрия ΠΊΠ°ΠΊ ΠΎΠ΄ΠΈΠ½ ΠΈΠ· Π²Π°ΠΆΠ½Π΅ΠΉΡˆΠΈΡ… инструмСнтов дСндроэкологии ΠΈ Π΄Π΅Π½Π΄Ρ€ΠΎΠΊΠ»ΠΈΠΌΠ°Ρ‚ΠΎΠ»ΠΎΠ³ΠΈΠΈ сущСствСнно Ρ€Π°ΡΡˆΠΈΡ€ΡΠ΅Ρ‚ возмоТности исслСдований ΠΏΠΎ рСконструкции Ρ€Π°Π·Π»ΠΈΡ‡Π½Ρ‹Ρ… ΠΏΡ€ΠΈΡ€ΠΎΠ΄Π½Ρ‹Ρ… процСссов. ΠšΠ»Π°ΡΡΠΈΡ‡Π΅ΡΠΊΠΈΠΉ рСнтгСновский дСнситомСтричСский комплСкс DENDRO 2003, обладая ΠΎΠ±Ρ‰Π΅ΠΏΡ€ΠΈΠ·Π½Π°Π½Π½Ρ‹ΠΌΠΈ достоинствами, Ρ‚Π΅ΠΌ Π½Π΅ ΠΌΠ΅Π½Π΅Π΅ ΠΈΠΌΠ΅Π΅Ρ‚ ряд сущСствСнных нСдостатков, Ρ‚Π°ΠΊΠΈΡ… ΠΊΠ°ΠΊ высокая ΡΡ‚ΠΎΠΈΠΌΠΎΡΡ‚ΡŒ, Π³Ρ€ΠΎΠΌΠΎΠ·Π΄ΠΊΠΎΡΡ‚ΡŒ, использованиС рСнтгСновских ΠΏΠ»Ρ‘Π½ΠΎΠΊ ΠΈ Ρ‚.Π΄., Ρ‡Ρ‚ΠΎ Π²Ρ‹Π½ΡƒΠΆΠ΄Π°Π΅Ρ‚ ΠΈΡΠΊΠ°Ρ‚ΡŒ Π°Π»ΡŒΡ‚Π΅Ρ€Π½Π°Ρ‚ΠΈΠ²Π½Ρ‹Π΅ ΠΏΡƒΡ‚ΠΈ развития дСнситомСтрии Π³ΠΎΠ΄ΠΈΡ‡Π½Ρ‹Ρ… ΠΊΠΎΠ»Π΅Ρ†. Π’ Ρ€Π°Π±ΠΎΡ‚Π΅ прСдставлСн Π½ΠΎΠ²Ρ‹ΠΉ мСтодичСский ΠΏΠΎΠ΄Ρ…ΠΎΠ΄ ΠΊ ΠΈΠ·ΠΌΠ΅Ρ€Π΅Π½ΠΈΡŽ профиля плотности Π³ΠΎΠ΄ΠΈΡ‡Π½Ρ‹Ρ… ΠΊΠΎΠ»Π΅Ρ† Π΄Π΅Ρ€Π΅Π²ΡŒΠ΅Π² ΠΈ ΠΏΠΎΡΡ‚Ρ€ΠΎΠ΅Π½ΠΈΡŽ Ρ…Ρ€ΠΎΠ½ΠΎΠ»ΠΎΠ³ΠΈΠΉ ΠΏΠ°Ρ€Π°ΠΌΠ΅Ρ‚Ρ€ΠΎΠ² плотности дрСвСсных ΠΊΠΎΠ»Π΅Ρ†, основанный Π½Π° Ρ€Π°Π·Π΄Π΅Π»Π΅Π½ΠΈΠΈ Ρ‚ΠΎΡ‡Π΅ΠΊ изобраТСния ΠΊΠ»Π΅Ρ‚ΠΎΡ‡Π½ΠΎΠΉ структуры ΠΊΠΎΠ»Π΅Ρ† ΠΏΠΎ ΠΈΡ… контрастности, ΠΏΠΎΠ»ΡƒΡ‡ΠΈΠ²ΡˆΠΈΠΉ Π½Π°Π·Π²Π°Π½ΠΈΠ΅ пиксСль-контрастной дСнситомСтрии (Pixel Contrast Densitometry, PiC densitometry). ΠŸΡ€ΠΎΠ²Π΅Π΄Π΅Π½Π° ΡΠΊΡΠΏΠ΅Ρ€ΠΈΠΌΠ΅Π½Ρ‚Π°Π»ΡŒΠ½Π°Ρ апробация Ρ€Π°Π·Ρ€Π°Π±ΠΎΡ‚Π°Π½Π½Ρ‹Ρ… ΠΌΠ΅Ρ‚ΠΎΠ΄ΠΎΠ² PiC дСнситомСтрии ΠΏΡ€ΠΈ ΠΏΠΎΠΌΠΎΡ‰ΠΈ дСмонстратора, Ρ€Π΅Π°Π»ΠΈΠ·ΠΎΠ²Π°Π½Π½ΠΎΠ³ΠΎ Π² Π²ΠΈΠ΄Π΅ ΠΏΡ€ΠΎΠ³Ρ€Π°ΠΌΠΌΠ½ΠΎΠ³ΠΎ обСспСчСния, ΠΏΠΎΠ·Π²ΠΎΠ»ΡΡŽΡ‰Π΅Π³ΠΎ Π²Ρ‹ΠΏΠΎΠ»Π½ΡΡ‚ΡŒ измСрСния профиля плотности Π³ΠΎΠ΄ΠΈΡ‡Π½Ρ‹Ρ… ΠΊΠΎΠ»Π΅Ρ† ΠΈ ΠΏΠΎΠ»ΡƒΡ‡Π°Ρ‚ΡŒ Ρ…Ρ€ΠΎΠ½ΠΎΠ»ΠΎΠ³ΠΈΠΈ Ρ€Π°Π·Π»ΠΈΡ‡Π½Ρ‹Ρ… Π΅Π³ΠΎ ΠΏΠ°Ρ€Π°ΠΌΠ΅Ρ‚Ρ€ΠΎΠ². Π‘Ρ€Π°Π²Π½ΠΈΡ‚Π΅Π»ΡŒΠ½Ρ‹ΠΉ Π°Π½Π°Π»ΠΈΠ· Ρ€Π΅Π·ΡƒΠ»ΡŒΡ‚Π°Ρ‚ΠΎΠ² ΠΈΠ·ΠΌΠ΅Ρ€Π΅Π½ΠΈΠΉ ΠΈ Ρ„ΡƒΠ½ΠΊΡ†ΠΈΠΎΠ½Π°Π»ΡŒΠ½Ρ‹Ρ… характСристик рСнтгСновской ΠΈ PiC дСнситомСтрии ΠΏΠΎΠΊΠ°Π·Π°Π», Ρ‡Ρ‚ΠΎ дСнситомСтричСский комплСкс, построСнный Π½Π° Π±Π°Π·Π΅ Ρ€Π°Π·Ρ€Π°Π±ΠΎΡ‚Π°Π½Π½Ρ‹Ρ… ΠΌΠ΅Ρ‚ΠΎΠ΄ΠΎΠ² ΠΈ ΠΏΡ€ΠΎΠ³Ρ€Π°ΠΌΠΌΠ½ΠΎΠ³ΠΎ обСспСчСния PiC дСнситомСтрии, позволяСт ΠΏΠΎΠ»ΡƒΡ‡Π°Ρ‚ΡŒ Ρ€Π΅Π·ΡƒΠ»ΡŒΡ‚Π°Ρ‚Ρ‹, ΠΈΠ΄Π΅Π½Ρ‚ΠΈΡ‡Π½Ρ‹Π΅ Ρ€Π΅Π·ΡƒΠ»ΡŒΡ‚Π°Ρ‚Π°ΠΌ рСнтгСновской дСнситомСтрии, ΠΎΠ±Π»Π°Π΄Π°Π΅Ρ‚ большСй Ρ„ΡƒΠ½ΠΊΡ†ΠΈΠΎΠ½Π°Π»ΡŒΠ½ΠΎΡΡ‚ΡŒΡŽ, мСньшСй ΡΡ‚ΠΎΠΈΠΌΠΎΡΡ‚ΡŒΡŽ ΠΈ способСн ΠΏΠΎΠ»Π½ΠΎΡΡ‚ΡŒΡŽ Π·Π°ΠΌΠ΅Π½ΠΈΡ‚ΡŒ собой рСнтгСновский дСнситомСтричСский комплСкс DENDRO 2003 Π² ΡˆΠΈΡ€ΠΎΠΊΠΎΠΌ спСктрС дСндроэкологичСских ΠΈ дСндроклиматичСских исслСдованийTree rings are the most reliable high-resolution proxy archive for past climate and environmental changes, and X‑ray densitometry is an important tool, which significantly expands the possibilities of dendroecology and dendroclimatology. The classic X‑ray densitometric laboratory DENDRO 2003 with all its advantages, however, has a number of drawbacks, such as its high price, installation size, requirement of X‑ray films and experienced technical staff, etc., which forces one to look for alternatives. The paper presents a new methodological approach to measuring wood density, developing tree-ring density profiles, and constructing tree- ring density chronologies. The proposed method – contrast densitometry (PiC densitometry) – is based on the pixel contrast in a high- resolution image of ring structures. Initial experimental tests using a specially developed demonstrator showed the strength and functionality of our approach, which produced results comparable to those derived by the traditional X‑ray DENDRO 2003 technique. This new methodology is capable of replacing traditional DENDRO 2003 applications in a wide range of dendroecological and dendroclimatic studie

    Structural and Optical Properties of Silicon Carbide Powders Synthesized from Organosilane Using High-Temperature High-Pressure Method

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    The development of new strategies for the mass synthesis of SiC nanocrystals with high structure perfection and narrow particle size distribution remains in demand for high-tech applications. In this work, the size-controllable synthesis of the SiC 3C polytype, free of sp2 carbon, with high structure quality nanocrystals, was realized for the first time by the pyrolysis of organosilane C12H36Si6 at 8 GPa and temperatures up to 2000 Β°C. It is shown that the average particle size can be monotonically changed from ~2 nm to ~500 nm by increasing the synthesis temperature from 800 Β°C to 1400 Β°C. At higher temperatures, further enlargement of the crystals is impeded, which is consistent with the recrystallization mechanism driven by a decrease in the surface energy of the particles. The optical properties investigated by IR transmission spectroscopy, Raman scattering, and low-temperature photoluminescence provided information about the concentration and distribution of carriers in nanoparticles, as well as the dominant type of internal point defects. It is shown that changing the growth modes in combination with heat treatment enables control over not only the average crystal size, but also the LO phononβ€”plasmon coupled modes in the crystals, which is of interest for applications related to IR photonics
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