10 research outputs found
Mössbauer spectroscopy as a powerful tool to study local electronic structure
No full textInternational audienc
Photoinduced changes of mechanical stress in amorphous Ge-As-S(Se) film/Si substrate systems
No full textA comparative Raman study of the local structure in (Ge2S3)(x)(As2S3)(1-x) and (GeS2)(x)(As2S3)(1-x) glasses
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Composition and temperature dependence of the low-frequency Raman scattering in Ge-As-S glasses (vol 347, pg 187, 2004)
No full textComposition and temperature dependence of the low-frequency Raman scattering in Ge-As-S glasses
No full textXPS study of photo- and thermally-induced changes in amorphous Ge xAs40-xS60
No full textcited By 8International audienceThe electronic structure of GexAs40- xS60 glasses and amorphous films has been obtained by means of X-ray photoelectron spectroscopy. Core level peaks and valence band spectra in the dependence on the composition as well as on structural changes initiated by illumination and/or annealing have been investigated and discussed. © 2005 Elsevier B.V. All rights reserved
