The effect of the spatial sampling rate on quantitative phase information extracted from planar and tomographic edge illumination x-ray phase contrast images

The effect of the spatial sampling rate on the quantitative phase information that can be retrieved from planar and tomographic edge illumination (EI) x-ray phase contrast imaging (XPCi) with a laboratory-based prototype scanner is analysed. The study is conducted on simulated and experimental data from a custom-built phantom. Optimal sampling rates, i.e. the minimum ones allowing the unambiguous extraction of quantitative phase measurements from the acquired data, are identified for planar and tomographic imaging. One of the key outcomes of this study is the demonstration that the optimal sampling rate in tomographic EI XPCi is low, allowing the implementation of low-dose volumetric imaging without having to compromise on quantitative accuracy