15 research outputs found
Two-step model versus one-step model of the inter-polarization conversion and statistics of CdSe/ZnSe quantum dot elongations
The magneto-optical inter-polarization conversions by a layer of quantum dots
have been investigated. Various types of polarization response of the sample
were observed as a function of external magnetic field and of the orientation
of the sample. The full set of experimental dependences is analyzed in terms of
a one-step and a two-step model of spin evolution. The angular distribution of
the quantum dots over the directions of elongation in the plane of the sample
is taken into account in terms of the two models, and the model predictions are
compared with experimental observations
Characterization of stress in semiconductor wafers using birefringence measurements
The nondestructive optical method for quality control based on measurement
of birefringence in semiconductor wafers is described. The influence of crystallographic
orientation and multiple reflections in wafers on measured parameters are discussed.
Also the full description of the device used for investigation of commercial
semiconductor wafers is given. The last part of the article is devoted to the
results of experimental investigations of semiconductor wafers during manufacturing
of semiconductor devices and IC